Cypress Semiconductor Perform STK12C68, Руководство пользователя

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STK12C68
Document Number: 001-51027 Rev. ** Page 8 of 20
Data Retention and Endurance
Parameter Description Min Unit
DATA
R
Data Retention 100 Years
NV
C
Nonvolatile STORE Operations 1,000 K
Capacitance
In the following table, the capacitance parameters are listed.
[6]
Parameter Description Test Conditions Max Unit
C
IN
Input Capacitance T
A
= 25
°
C, f = 1 MHz,
V
CC
= 0 to 3.0 V
8 pF
C
OUT
Output Capacitance 7 pF
Thermal Resistance
In the following table, the thermal resistance parameters are listed.
[6]
Parameter Description Test Conditions 28-SOIC
28-PDIP
(300 mil)
28-PDIP
(600 mil)
28-CDIP 28-LCC Unit
Θ
JA
Thermal Resis-
tance
(Junction to
Ambient) Test conditions follow
standard test methods and
procedures for measuring
thermal impedance, per EIA /
JESD51. 46.55 45.16 55.84 46.1 95.31
°
C/W
Θ
JC
Thermal Resis-
tance
(Junction to Case) 27.95 31.62 25.74 5.01 9.01
°
C/W
Figure 6. AC Test Loads
AC Test Conditions
5.0V
Output
30 pF
R1 963
Ω
R2
512
Ω
5.0V
Output
5 pF
R1 963
Ω
R2
512
Ω
For Tri-state Specs
Input Pulse Levels .................................................. 0 V to 3 V
Input Rise and Fall Times (10% to 90%) ...................... <5 ns
Input and Output Timing Reference Levels .......................1.5
Note
6. These parameters are guaranteed by design and are not tested.
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