Cypress Semiconductor NoBL CY7C1352G, Техническое описание

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CY7C1352G
Document #: 38-05514 Rev. *D Page 8 of 12
Switching Characteristics
Over the Operating Range
[16, 17]
Parameter Description
–250 –200 –166 –133
Unit Min. Max. Min. Max. Min. Max. Min. Max.
t
POWER
V
DD
(typical) to the first Access
[12]
1 1 1 1 ms
Clock
t
CYC
Clock Cycle Time 4.0 5.0 6.0 7.5 ns
t
CH
Clock HIGH 1.7 2.0 2.5 3.0 ns
t
CL
Clock LOW 1.7 2.0 2.5 3.0 ns
Output Times
t
CO
Data Output Valid After CLK Rise 2.6 2.8 3.5 4.0 ns
t
DOH
Data Output Hold After CLK Rise 1.0 1.0 1.5 1.5 ns
t
CLZ
Clock to Low-Z
[13, 14, 15]
0 0 0 0 ns
t
CHZ
Clock to High-Z
[13, 14, 15]
2.6 2.8 3.5 4.0 ns
t
OEV
OE LOW to Output Valid 2.6 2.8 3.5 4.0 ns
t
OELZ
OE LOW to Output Low-Z
[13, 14, 15]
0 0 0 0 ns
t
OEHZ
OE HIGH to Output High-Z
[13, 14, 15]
2.6 2.8 3.5 4.0 ns
Set-up Times
t
AS
Address Set-up Before CLK Rise 1.2 1.2 1.5 1.5 ns
t
ALS
ADV/LD Set-up Before CLK Rise 1.2 1.2 1.5 1.5 ns
t
WES
GW, BW
[A:B]
Set-Up Before CLK Rise 1.2 1.2 1.5 1.5 ns
t
CENS
CEN Set-up Before CLK Rise 1.2 1.2 1.5 1.5 ns
t
DS
Data Input Set-up Before CLK Rise 1.2 1.2 1.5 1.5 ns
t
CES
Chip Enable Set-up Before CLK Rise 1.2 1.2 1.5 1.5 ns
Hold Times
t
AH
Address Hold After CLK Rise 0.3 0.5 0.5 0.5 ns
t
ALH
ADV/LD Hold after CLK Rise 0.3 0.5 0.5 0.5 ns
t
WEH
GW, BW
[A:B]
Hold After CLK Rise 0.3 0.5 0.5 0.5 ns
t
CENH
CEN Hold After CLK Rise 0.3 0.5 0.5 0.5 ns
t
DH
Data Input Hold After CLK Rise 0.3 0.5 0.5 0.5 ns
t
CEH
Chip Enable Hold After CLK Rise 0.3 0.5 0.5 0.5 ns
Notes:
12. This part has a voltage regulator internally; tpower is the time that the power needs to be supplied above V
DD
minimum initially before a read or write operation
can be initiated.
13. t
CHZ
, t
CLZ
,t
OELZ
, and t
OEHZ
are specified with AC test conditions shown in part (b) of AC Test Loads. Transition is measured ± 200 mV from steady-state voltage.
14. At any given voltage and temperature, t
OEHZ
is less than t
OELZ
and t
CHZ
is less than t
CLZ
to eliminate bus contention between SRAMs when sharing the same
data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed
to achieve tri-state prior to Low-Z under the same system conditions.
15. This parameter is sampled and not 100% tested.
16. Timing reference level is 1.5V when V
DDQ
= 3.3V and is 1.25V when V
DDQ
= 2.5V.
17. Test conditions shown in (a) of AC Test Loads unless otherwise noted.
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