38
175.0020 - DECADE Elite service manual - rev 03
Table III. Inputs on digital IO connector
Pin
Description
12* Cell on 1 (TTL
#
)
13
Cell on 2 (TTL)
14
Cell on 3 (TTL)
15* Cell off 1 (TTL)
16
Cell off 2 (TTL)
17
Cell off 3 (TTL)
18* Autozero 1 (TTL)
19
Autozero 2 (TTL)
20
Autozero 3 (TTL)
21* Start 1 (TTL)
22
Start 2 (TTL)
23
Start 3 (TTL)
24
Start 4 (TTL)
#
)Default status of TTL contact is high (3.3V).
*) Programmable Inputs (see DECADE Elite user manual for details.
In case the output/input test fails repeatedly please consult your Antec rep-
resentative.
MEM(ory) test
With the memory test the SRAM memory is checked. Every memory ad-
dress will be verified/tested by a WRITE/READ action. In case the test was
unsuccessful please contact your Antec representative for further advise.
RC filter test
This is a test specifically for internal USE at the Antec factory only. It is not
used for diagnostic purposes in the field.
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