Chapter 1 Overview
1-2.
1.1 Overview
MP1590B-30 High Precision Jitter Analysis provides MP1590B with a
higher precision, and more accurate Jitter measurement. This option
enhances the measurement accuracy and repeatability of Jitter Genera-
tion Measurement. The Jitter measurement accuracy of MP1590B with-
out MP1590B-30 High Precision Jitter Analysis is correctly calibrated by
the Phase Analysis Calibration Method, and is guaranteed. And fur-
thermore, MP1590B-30 High Precision Jitter Analysis gives highly pre-
cise tuning to the MP1590B.
The Phase Analysis Calibration Method was adopted in the ITU-T
O.172(April,2005).
Therefore, this method is Global Standard of the Jitter measurement in-
strument.
1.2 O.172
New
Recommendation
Verification Method for Jitter Measurement Accuracy
The ITU-T O.172(April,2005) defines the process for Jitter generation
measurement. The largest percentage of the Jitter generated by an op-
tical transmitter is the Pattern Dependent Jitter (PDJ). It is the re-
quired function for a Jitter measuring instrument to measure PDJ cor-
rectly. Anritsu established a unique method to measure PDJ accurately
using a digital sampling oscilloscope. This verification method was
proposed to ITU-T and adopted in the ITU-T O.172(April,2005). The
MP1590B is fully designed to measure PDJ accurately and is verified by
the newly adopted method.