Ametek Surtronic 25, Руководство пользователя

Страница: 10 / 60

Surtronic S25
remove or reduce unwanted data in order to look at wavelengths in
the region of interest.
Bandwidth.
Bandwidth is the ratio of the upper Cut-off (Lc) to
the lower Cut-off (Ls).
Sample Length.
The profile is divided into sample lengths l,
which are long enough to include a statistically reliable amount of
data. For roughness and waviness analysis, the sample length is
equal to the selected cut-off (lc) wavelength. The sample length is
also known as the cut-off length.
Evaluation Length.
The length in the direction of the X axis
used for assessing the profile under evaluation. The evaluation
length may contain one or more sample lengths. For the primary
profiles the evaluation length is equal to the sample length.
Note: almost all parameters are defined over one sample length,
however in practice more than one sample length is assessed
(usually five) and the mean calculated. This provides a better
statistical estimate of the parameters measured value.
ISO 3274-1996, ISO 4287-1997, ISO 4288-1996, ISO 11 562 and
other International Standards are followed where appropriate by
Taylor Hobson equipment.
More detailed information on surface texture in general and on
stylus-type measuring instruments in particular is covered in the
book 'Exploring Surface Texture', published by Taylor Hobson.
Parameter Definitions
Surface texture is quantified by parameters which relate to certain
characteristics of the texture. The Surtronic 25 offers the
following parameters:
Page 1-2