7-2
Test and Debug
AMD-K5 Processor Technical Reference Manual
18524C/0—Nov1996
■
Test Access Port (TAP) Boundary-Scan Testing—The JTAG
test access functions defined by the IEEE Standard Test
Access Port and Boundary--Scan Architecture (IEEE 1149.1-
1990) specification.
■
Hardware Debug Tool (HDT)—The hardware debug tool
(HDT), sometimes referred to as the debug port or Probe
mode, is a collection of signals, registers, and processor
microcode that is enabled when external debug logic drives
R/S Low or loads the AMD-K5 processor’s Test Access Port
(TAP) instruction register with the USEHDT instruction.
The test-related signals and their descriptions include the fol-
lowing:
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FLUSH—Page 5-65
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FRCMC—Page 5-68
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IERR—Page 5-78
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INIT—Page 5-81
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PRDY—Page 5-103
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R/S—Page 5-107
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RESET—Page 5-109
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TCK—Page 5-127
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TDI—Page 5-128
■
TDO—Page 5-129
■
TMS—Page 5-130
■
TRST—Page 5-131
The sections that follow provide details on each of the test and
debug features.
Содержание AMD-K5
Страница 1: ...AMD K5 Processor Technical Reference Manual TM...
Страница 10: ...x AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Страница 24: ...1 4 Overview AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Страница 54: ...2 30 Internal Architecture AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Страница 116: ...4 26 Performance AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Страница 356: ...6 44 System Design AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Страница 380: ...7 24 Test and Debug AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Страница 396: ...A 16 AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Страница 406: ...I 10 Index AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...