Agilent Technologies 54657A, Руководство пользователя

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Creating a frequency testing mask
A mask can be used to test the frequency of the input signal. The shape of
the mask varies depending on the shape of the signal to be tested. A mask
designed for testing a sine wave cannot be used to test a square wave.
Different masks are needed for different shapes of signals. Using the
calibrated vertical vernier, position, and time base of the
Agilent 54600–Series oscilloscope, a mask can be re-used to test signals of
similar shapes but different frequencies and amplitudes.
To test the frequency of the signal, the period of the signal is tested instead
of actually measuring the frequency. The test can be conducted by triggering
on an edge of the signal and testing for the location of the second edge. An
example mask is shown in the following figure.
Example mask for testing the frequency of a sine wave
Figure 2– 14
Operating the Measurement/Storage Module
Creating a frequency testing mask
2–44