5
The 3M
™
ScanEM-C Electromagnetic Near-Field Probes can:
Pinpoint the location of a component, circuit area or trace with high
emission levels
Predict radiated EMC test results
Pre-test your product prior to an official compliance test in order to
identify potential problems early
Quickly troubleshoot a product that has failed a compliance test
Find EM leakage on enclosures, cables and connectors
Find sources of EM interference
Show the presence of a high-frequency signal on a trace or wire
without contact
Help to troubleshoot circuits and wiring
Work as amplified near-field probes when connected to a
spectrum analyzer
Work as non-contact high-bandwidth voltage and current
oscilloscope probes
Work as field-strength probes when used with a multimeter
Содержание ScanEM-C
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