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Data Communications and Diphase Testing Manual

January 2016

21148872, Rev. 002

Page 11

2

Chapter 2  

Data Communications Testing

This chapter provides step-by-step instructions for testing data communications inter-
faces. Topics discussed in this chapter include the following:

•

“Data communications testing features and capabilities” on page 12

•

“Specifying interface settings” on page 12

•

“Specifying the timing settings” on page 13

•

“Specifying data settings” on page 14

•

“Specifying signal and flow control settings” on page 15

•

“Selecting a BER pattern” on page 16

•

“Defining user programmable patterns” on page 19

•

“Performing BER analysis” on page 20

•

“Measuring round trip delay” on page 21

•

“Troubleshooting inverted clocks” on page 22

Summary of Contents for MSAM

Page 1: ...Multiple Services Application Module MSAM Data Communications and Diphase Testing Manual JDSU HS Datacom Module Specs Provided by www AAATesters com ...

Page 2: ......

Page 3: ...Viavi Solutions 1 844 GO VIAVI www viavisolutions com Multiple Services Application Module MSAM Data Communications and Diphase Testing Manual ...

Page 4: ...sting Manual is ML 21138652 The catalog number for electronic manuals on USB is CEML 21138299 Terms and conditions Specifications terms and conditions are subject to change without notice The provi sion of hardware services and or software are subject to Viavi s standard terms and conditions available at www viavisolutions com en terms and conditions Open Source Disclaimer IMPORTANT READ CAREFULLY...

Page 5: ...15 of the FCC Rules Operation is subject to the following two conditions 1 This device may not cause harmful interference and 2 This device must accept any interference received including interference that may cause undesired operation This device contains FCC ID POOWMLC40 If this equipment does cause harmful interference to radio or television reception which can be determined by turning the equi...

Page 6: ...l applicable national and international waste legislation It is the responsibility of the equipment owner to return equipment and batteries to Viavi for appropriate disposal If the equipment or battery was imported by a reseller whose name or logo is marked on the equipment or battery then the owner should return the equipment or battery directly to the reseller Instructions for returning waste eq...

Page 7: ...Testing 1 Navigating the Main screen 2 Datacom buttons 2 Interface 2 Signal mode 2 Equipment 3 Synth Frequency kHz 3 Pattern 3 LED panel 3 Data and Control LEDs 3 Diphase LEDs 4 Actions panel 4 Identifying test requirements 4 Interface 5 Equipment emulation mode 5 Signal mode 5 Timing mode 5 Data rate 5 Flow control 6 Pattern 6 RX input termination 6 Timing sources 6 Step 1 Configuring the test 6 ...

Page 8: ...ing user programmable patterns 19 Performing BER analysis 20 Measuring round trip delay 21 Troubleshooting inverted clocks 22 Chapter 3 Diphase Testing 23 About Diphase testing 24 Manchester Diphase encoding 24 Conditioned Diphase encoding 25 Specifying the clock frequency 25 Specifying data settings 26 Selecting a BER pattern 26 Performing BER analysis 26 Measuring round trip delay 27 Chapter 4 T...

Page 9: ...g tests 42 Some settings are disabled when I configure my tests 43 Resolution 43 User interface is not launching 43 Resolution 43 Which MSAM or application module is selected 43 Resolution 43 No receive clock is detected 43 Resolution 43 The Rx Clock Invert LED is illuminated 43 The unit is not obtaining pattern synchronization 44 Test results are inconsistent 44 Upgrades and options 45 How do I u...

Page 10: ...Contents Data Communications and Diphase Testing Manual Page viii 21148872 Rev 002 January 2016 ...

Page 11: ...prefix explains how to use this manual Topics discussed include the following Purpose and scope on page x Assumptions on page x Terminology on page x Data Communications and Diphase Testing Manual on page xi Conventions on page xii Technical assistance on page xiv Safety and compliance information on page xiv ...

Page 12: ...nded as the MTS 6000A in Europe and it is interchangeably referred to as the T BERD 6000A MTS 6000A MTS6000A and Media Test Set 6000A throughout supporting documentation The T BERD 8000 is branded as the MTS 8000 in Europe and it is interchangeably referred to as the T BERD 8000 MTS 8000 MTS 8000 MTS8000 and Media Test Set 8000 throughout supporting documentation The following terms have a specifi...

Page 13: ...ides detailed test result descriptions and troubleshooting topics Use this manual in conjunction with the following manuals 6000A Base Unit User Manual This manual provides an overview specifications and instructions for proper operation of the 6000A base unit 8000 Base Unit User Manual This manual provides an overview specifications and instructions for proper operation of the 8000 base unit Dual...

Page 14: ...k the Properties tab Type the name of the probe in the Probe Name field Directory names file names and code and output messages that appear in a command line interface or in some graphical user interfaces GUIs NANGT_DATA_DIR results directory test_products users defaultUser xml file name All results okay output message Text you must type exactly as shown into a command line interface text file or ...

Page 15: ...or more information This symbol represents a risk of a hot surface It may be associated with either a DANGER WARNING CAUTION or ALERT message See Table 3 for more information This symbol represents a risk associated with fiber optic lasers It may be associated with either a DANGER WARNING CAUTION or ALERT mes sage See Table 3 for more information This symbol located on the equipment battery or the...

Page 16: ... ship with your instrument CAUTION Indicates a potentially hazardous situation that if not avoided could result in minor or moderate injury and or damage to equip ment It may be associated with either a general hazard high voltage or risk of explosion symbol See Table 2 for more information When applied to software actions indicates a situation that if not avoided could result in loss of data or a...

Page 17: ... and Diphase testing using the MSAM Topics discussed in this chapter include the following Navigating the Main screen on page 2 Identifying test requirements on page 4 Step 1 Configuring the test on page 6 Step 2 Performing a self test on page 7 Step 3 Connecting the instrument to the circuit on page 8 Step 4 Starting the test on page 8 Step 5 Viewing test results on page 9 ...

Page 18: ...t Datacom buttons In addition to the standard elements Datacom buttons are available that allow you to quickly specify key settings When testing using a Diphase PIM the Synth Frequency kHz and Pattern are the only buttons provided Interface Use the Interface button to select the interface that you intend to test Signal mode Use the Signal mode button to indicate whether the circuit under test uses...

Page 19: ...detected BER pattern has been inverted Data and Control LEDs In addition to the Summary LEDs Data LEDs provide information on the state of the data and clock signal lead circuits between the instrument and a DTE or DCE device Control LEDs indicate whether each signal lead circuit is on or off Table 4 lists each signal lead circuit the direction of the signal to or from the DCE the ITU T designatio...

Page 20: ...are provided that allow you to control the CTS DSR RLSD RI and TM leads If you are testing a V 35 interface a button is provided for the CI lead instead of the RI lead When testing using a Diphase PIM the signal lead actions do not appear because they are not needed for your test Identifying test requirements Before testing you need to identify the test requirements that you will specify as param ...

Page 21: ...rument is establishing a link directly to a DTE you should configure the instrument to emulate a DCE A network element s link partner s emulation mode always dictates the emulation mode for the element A DTE link partner communicates with elements in DCE mode a DCE link partner communicates with elements in DTE mode Signal mode If you are testing an EIA 530 EIA 530A RS 449 V 36 or MIL 188 114 inte...

Page 22: ...ely for your test See Table 7 on page 18 for a complete list of patterns RX input termination If you are testing a balanced circuit specify the input termination for the instrument s receiver in ohms Timing sources Determine the timing sources for transmitted and received data Step 1 Configuring the test Before you configure a test be certain to complete the information that you want to include wh...

Page 23: ...nfigure your test you should verify that the instrument is operating properly by performing a self test for the interface before connecting to the circuit you are testing To perform a self test 1 Configure the test see Step 1 Configuring the test on page 6 The instrument uses the internal synthesizer as the clock source during a self test therefore you do not need to specify a clock source for rec...

Page 24: ...s a yellow band When available monitor cables will be identified using a blue band All cables are six feet long Detailed instructions for connecting the instrument to the interface are provided in the Getting Started manual that shipped with your instrument Step 4 Starting the test After you configure a test perform a self test and connect the instrument to the inter face you are ready to start th...

Page 25: ...or a standard HS Datacom application Results for the category you selected appear in the result window 4 Optional To observe results for a different group or category in another result window press the buttons at the top of the window to specify the group and cate gory For descriptions of each result refer to Chapter 4 Test Results NOTE Running Multiple Tests If you are using two MSAMs with HS Dat...

Page 26: ...owing topics refer to the Getting Started manual that shipped with your instrument Expanding and collapsing result measurements Changing the result layout Using the entire screen for results About histogram results Viewing a histogram About the Event log About result graphs Clearing History results Creating and maintaining Custom result groups For descriptions of each result refer to Chapter 4 Tes...

Page 27: ...lude the following Data communications testing features and capabilities on page 12 Specifying interface settings on page 12 Specifying the timing settings on page 13 Specifying data settings on page 14 Specifying signal and flow control settings on page 15 Selecting a BER pattern on page 16 Defining user programmable patterns on page 19 Performing BER analysis on page 20 Measuring round trip dela...

Page 28: ...tire digital link in both directions allowing you to isolate problems to a specific direction BER testing You can BER test a variety of data communication interfaces to verify error free performance and transmission by transmitting ANSI ITU user programmable and long user patterns LUP You can also specify the BERT pattern sync loss criteria and the action to be taken upon loss of pattern sync Sync...

Page 29: ...rom the instrument If you configured the instrument for synchronous testing to use an internal or recovered clock source you can specify the synthesizer frequency for your test in kHz You do not need to specify the synthesizer frequency for synchronous testing if you are using a clock source other than internal or recovered To specify timing settings 1 Select the Setup soft key then select the Tim...

Page 30: ...pecified Specifying data settings After you specify the interface and timing settings you can specify the data settings for your test including the polarity for the transmitted and received data the block length in bits and a setting that controls whether the instrument detects data loss The avail able settings vary based on the current timing mode synchronous or asynchronous Table 6 Synthesizer f...

Page 31: ...lead conditions Setting Sync Async Value Data Bits X 5 bits for baudot encoding 6 bits for BCDIC encoding 7 bits for ASCII encoding 8 for EBCDIC encoding Parity X None Odd Even Stop Bits X 1 1 5 2 Rx Data Polarity X X Normal Mark Inverted Mark Tx Data Polarity X X Normal Mark Inverted Mark Data Loss Enable X X On If on the Rx Data Loss LED on the Main screen will illuminate red if data loss is det...

Page 32: ...ou also specify sync loss criteria to control the unit s sensitivity in declaring loss of synchronization and then indicate when the unit should attempt to regain synchronization If you want to define your own pattern see Defining user programmable patterns on page 19 To select a BER pattern 1 Select the Setup soft key then select the Pattern setup tab 2 Specify the following settings Setting Sync...

Page 33: ...res pattern sync loss regardless of error rate Sync Loss Criteria X Low Declares pattern sync loss when 30 character errors are counted in less than 60 received characters High Declares pattern sync loss when 20 000 bit errors are counted in less than 100 000 bits Never Never declares pattern sync loss regardless of error rate Pattern Mode User Defined patterns only X X Continuous Sends the patter...

Page 34: ...imum zeroes condition 1 1 10 10 Minimum stress on clock recovery circuits 1 3 1000 1000 A 1 followed by three 0s 1 4 10000 10000 A 1 followed by 4 0s 1 7 10000000 10000000 Maximum stress of the 12 5 ones density require ments for T1 circuits 3 1 1110 1110 Three 1s followed by one 0 1110 pattern 7 1 11111110 11111110 Seven 1s followed by one 0 11111110 pattern 63 26 1 Selects the 26 1 Pseudorandom ...

Page 35: ...orandom patterns QRSS Quasi random signal source Simulation of live data QRSS is the standard pseudo random pattern for T1 testing QBF FOX Quick brown fox message A message that includes numbers 0 9 and all upper case letters THE QUICK BROWN FOX JUMPS OVER THE LAZY DOG 0123456789 NOTE In asynchronous mode this pattern is trans mitted according to the number of data bits you speci fied in the chara...

Page 36: ...attern followed by a series of ones If you selected Single use the Bert Pattern Insert button on the Main screen to insert the pattern The pattern is defined Performing BER analysis Performing BER analysis of a circuit involves configuring the test connecting to the circuit starting the test inserting logic errors and then viewing test results The scenario below provides the basic steps involved y...

Page 37: ...ERT and the G 821 cate gories see Step 5 Viewing test results on page 9 BER analysis is complete Measuring round trip delay Measuring round trip delay involves selecting the R TRIP DELAY BER pattern config uring the remaining settings for the test connecting to the circuit starting the test and then viewing test results When you start the test the instrument inserts 16 consecutive bit errors into ...

Page 38: ...tep 4 Starting the test on page 8 7 Verify that the PATTERN SYNC LED is illuminated 8 Observe the test results particularly the R Trip Delay result in the BERT category see Step 5 Viewing test results on page 9 Round trip delay is measured Troubleshooting inverted clocks The instrument declares clock inversion whenever the received clock polarity is deter mined to be opposite to the polarity Norma...

Page 39: ...iphase testing Topics discussed in this chapter include the following About Diphase testing on page 24 Manchester Diphase encoding on page 24 Conditioned Diphase encoding on page 25 Specifying the clock frequency on page 25 Specifying data settings on page 26 Selecting a BER pattern on page 26 Performing BER analysis on page 26 Measuring round trip delay on page 27 ...

Page 40: ...ped with your instrument and the concepts presented in Chapter 1 Basic Testing of this manual Manchester Diphase encoding Manchester Diphase encoding ensures that there is a phase transition each time the logic level changes Each time the data signal is logic level 1 a high to low phase tran sition occurs Each time the data signal is a logic level 0 a low to high phase tran sition occurs See Figur...

Page 41: ...sing a low to high phase transition Each time the data signal is logic level 1 the phase transition is inverted If the previous bit used a high to low phase transition the 1 is encoded using a low to high phase transition If the previous bit used a low to high phase transition the 1 is encoded using a high to low phase transition See Figure 6 for an illustration of a Conditioned Diphase encoded bi...

Page 42: ...A list of available patterns is provided in Table 7 on page 18 For step by step instructions on specifying pattern settings see Selecting a BER pattern on page 16 If you want to define your own pattern see Defining user programmable patterns on page 19 Performing BER analysis Performing BER analysis of a Diphase circuit involves configuring the test connecting to the circuit starting the test inse...

Page 43: ...volves selecting the R TRIP DELAY BER pattern config uring the remaining settings for the test connecting to the circuit starting the test and then viewing test results When you start the test the instrument inserts 16 consecutive bit errors into the transmitted R TRIP DELAY pattern and then measures the amount of time in milliseconds before 16 consecutive bit errors are detected on the received R...

Page 44: ... delay Data Communications and Diphase Testing Manual Page 28 21148872 Rev 002 January 2016 8 Observe the test results particularly the R Trip Delay result in the BERT category see Step 5 Viewing test results on page 9 Round trip delay is measured ...

Page 45: ...ults that are available when performing Data communications or Diphase tests Topics discussed in this chapter include the following About test results on page 30 Summary Status results on page 30 LED results on page 31 Signal results on page 34 BERT results on page 34 Data results on page 35 G 821 results on page 36 Histograms on page 38 Event Logs on page 39 ...

Page 46: ...d option for the instrument and if the results are applicable to the current test configuration For example the Diphase result group only appears if you purchase the optional Conditioned Diphase interface module and select the Diphase application After you connect the instrument to the circuit press the START STOP button and detect a receive clock results for the configured test accumulate and app...

Page 47: ...cting the box to the left of the name If Pattern Invert On appears this indicates either the unit is receiving an inverted BERT pattern while expecting an upright pattern or it is receiving an upright BERT pattern while expecting an inverted pattern LED results Table 8 describes the LEDs provided during HS Datacom and Diphase testing Only the LEDs that are applicable for your test appear in the LE...

Page 48: ...clock was detected then lost since the last test start or restart X X Tx Clock Present Green A transmit clock is detected Red A transmit clock was detected then lost since the last test start or restart X X Rx Clock Invert Green The polarity or the receive clock is the opposite of that specified for the instrument Red The polarity or the receive clock is the opposite of that specified for the inst...

Page 49: ... clear to send circuit If the instrument is configured to test a RS 449 V 36 interface the same circuit is represented using CS Table 9 Data LEDs Data LED Circuits1 1 Each of the circuits is represented using the acronym specified in its interface standard For example if the instrument is configured to test an RS 232 interface TD is used to represent the Transmit Data circuit If the unit is config...

Page 50: ...loss of data after at least one data transition occurred since starting or restarting the test Rx Frequency Frequency derived from receiver clock counter Tx Clock Losses Count of the number of instances where the transmit clock was lost for a duration exceeding that specified as the clock loss threshold since starting or restarting the test Tx Frequency Frequency derived from transmission clock co...

Page 51: ...erval Pattern Losses Number of times pattern synchronization was lost Pattern Slips Number of times data bits were added to or removed from the receive pattern NOTE You must transmit a pseudorandom pattern to observe pattern slips Total Blocks Number of blocks received after pattern synchroni zation has been achieved Table 12 BERT results Continued Test Result Description Table 13 Data results Tes...

Page 52: ... seconds since initial pattern synchronization expressed as a percentage EFS Number of error free seconds divided by number of seconds since pattern synchronization expressed as a percentage ES Number of seconds during which one or more bit errors were detected divided by number of seconds since the last test restart expressed as a percentage The unit stops calculating this result when the UAS res...

Page 53: ...the 10 that triggered the unavailable seconds count as unavailable Example If a test runs for 25 seconds after initial pattern synchronization and each of the 25 seconds has a BER better than or equal to 10 3 the instrument counts the 25 seconds as available and the Avail Secs count in the G 821 Result Category is 25 In the 26th second the BER becomes worse than 10 3 The 27th and 28th seconds also...

Page 54: ...y of test results Controls are available that allow you to navigate the display To view a Histogram On the instrument set the Result Group to Summary and the category to Histo gram The histogram appears For details on configuring and navigating through the histo gram refer to the Getting Started manual that shipped with your instrument Figure 9 Histogram HS Datacom application ...

Page 55: ...ng the course of your test The log displays the value for each event and provides the date and time that the event occurred To view the Event Log On the instrument set the Result Group to Summary and the category to Event Log The Event Log appears For details on navigating through the log refer to the Getting Started manual that shipped with your instrument Figure 10 Event Log HS Datacom applicati...

Page 56: ...Chapter 4 Test Results Event Logs Data Communications and Diphase Testing Manual Page 40 21148872 Rev 002 January 2016 ...

Page 57: ...pter 5 Troubleshooting This chapter describes how to identify and correct issues encountered when using the instrument Topics discussed in this chapter include the following About troubleshooting on page 42 Before testing on page 42 Performing tests on page 42 Upgrades and options on page 45 ...

Page 58: ...pplications for currently inserted PIMs will appear on the Test menu For example if an SFP and XFP PIM are inserted in the MSAM chassis you will not see HS Datacom applications Some applications only appear if you purchased the associ ated testing option Resolution Insert the appropriate PIM for the application and verify that you have the required testing options installed Can I hot swap PIMs No ...

Page 59: ...y to display the user interface Which MSAM or application module is selected When testing using an 8000 and two MSAMs via a DMC which test is in the fore ground and which is running in the background Resolution On the Main screen a button appears in the menu bar indicating which DMC slot and port is currently selected No receive clock is detected After starting a test the instrument does not detec...

Page 60: ...t is operating properly see Step 2 Performing a self test on page 7 Check the Mark and Space LEDs for the Receive Data and Transmit Data circuits to verify that the instrument is receiving data transitions If a solid mark is being received check the state of all signaling leads to make sure the proper signaling leads are being asserted Frequently a DCE will not allow data to proceed when it does n...

Page 61: ...ow do I upgrade my instrument Upgrades are installed from a USB key Instructions are provided with each software upgrade How do I install test options Test options are enabled by entering a Viavi provided challenge code Instructions are provided when you order test options Do software and test options move with the MSAM Test options are available when you connect the MSAM to a different base unit ...

Page 62: ...Chapter 5 Troubleshooting Upgrades and options Data Communications and Diphase Testing Manual Page 46 21148872 Rev 002 January 2016 ...

Page 63: ...it Error Rate BERT Bit error rate test A known pattern of bits is transmitted and errors received are counted to figure the BER The Bit Error Rate test is used to measure transmission quality C C Request to send to DCE circuit X 21 CCITT Comité Consultatif International Téléphonique et Télégraphique an organi zation that sets international communications standards CCITT is now known as the ITU Int...

Page 64: ...Data Terminal Equipment Equipment that serves as the data transmission source data transmission destination or both for the purpose of sending or receiving data Examples of DTEs include personal computers PCs data terminals and periph eral devices such as printers You can configure the instrument to emulate a DTE device when testing most data communications interfaces See DCE DTR Data terminal rea...

Page 65: ...iddle of each bit period which assists the receiver in retaining synchro nization Also referred to as Diphase encoding MIL 188c Specification describing a data communications interface that uses a 25 pin connector and unbalanced amplifiers for all circuits MIL 188 114 Specification describing a data communications interface that uses DB 25 connector or DB 37 connectors and unbalanced amplifiers fo...

Page 66: ...st mode circuits The RS 449 test mode circuits use unbalanced V 10 amplifiers The V 10 amplifiers can also be used for signaling circuits RS Request to send to DCE circuit RS 449 V 36 and MIL 188 114 RT Receiver signal element timing from DCE circuit all supported interfaces except V 35 and X 21 See S and SCR RTS Request to send to DCE circuit all supported interfaces except RS 449 V 36 X 21 and M...

Page 67: ...SCTE and X Tx Transmit U USB Universal Serial Bus A bus designed to handle a broad range of devices such as keyboards mouses printers modems and hubs V V 24 Recommendation describing a data communications interface that uses unbal anced bipolar slew rate limited V 28 amplifiers V 35 Recommendation describing a data communications interface that uses balanced V 35 amplifiers for clock and data circ...

Page 68: ...Glossary Data Communications and Diphase Testing Manual Page 52 21148872 Rev 002 January 2016 ...

Page 69: ...atterns 19 Diphase testing Conditioned Diphase encoding 25 E Emulation mode selecting 5 Encoding Conditioned Diphase 25 Event logs about 10 Expanding measurements 10 F Features and capabilities PDH 12 T Carrier 12 G G 821 results 36 Graphical Histogram results 38 Graphs about 10 H Histograms about 10 viewing 10 L Layout changing result 10 LEDs results 31 signal lead circuits 3 Log about event 10 L...

Page 70: ...lts 30 Sync Loss 17 T T Carrier testing features and capabilities 12 Test results about graphs 10 changing layout 10 collapsing 10 Control LED 33 custom 10 Data 35 Data LED 32 event logs 10 expanding 10 G 821 36 Graphical Histogram 38 histograms 10 LED 31 Logic 34 populating custom 10 setting category 9 setting group 9 setting the group and category 9 Signal 34 Summary 30 using entire screen 10 Te...

Page 71: ...Index Data Communications and Diphase Testing Manual January 2016 21148872 Rev 002 Page 55 U User programmable patterns defining 19 V Viewing histograms 10 ...

Page 72: ...Index Data Communications and Diphase Testing Manual Page 56 21148872 Rev 002 January 2016 ...

Page 73: ......

Page 74: ...h America 1 844 GO VIAVI 1 844 468 4284 Latin America 52 55 5543 6644 EMEA 49 7121 862273 APAC 1 512 201 6534 All Other Regions viavisolutions com contacts email TAC viavisolutions com 21148872 Rev 002 January 2016 English ...

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