Veeco 004-210-000, Instruction Manual

Page: 284 / 358

Electric Force (EFM) Imaging
Surface Potential Detection—Preparation
264 MultiMode SPM Instruction Manual Rev. B
14.6.1 Applying Voltage to the Sample Directly
When voltage is applied directly to the sample, there is no need to recon fi gure the jumpers. They
should remain jumpered as shipped from the factory ( Figure 14.6a ), and the sample should be
electrically insulated from the chuck.
Connect the external voltage source directly to the sample by attaching fi ne gauge wire to
appropriate contacts (e.g., on integrated circuits connect electrical leads directly to pads). For
normal operation, the sample chuck is held at ground; be certain to carefully any electrical
connections from the sample chuck.
Figure 14.6b Applying Voltage to Sample Diagram
14.6.2 Applying Voltage to the Sample Through Piezo Cap
When voltage is to be applied to the sample via the sample piezo cap for indirect surface potential
imaging, con
fi gure the jumpers as shown in Figure 14.6c .
Figure 14.6c Jumper con fi guration for application of voltage to sample via sample chuck.
Sample Chuck
Sample
Electrical Insulator
External Voltage
Source
>10 M
Ω
Indicates jumpers
External Voltage
Source
>10 M Ω
Ground
GND/OSC + DC
Unused
Auxiliary D
To AFM Tip
GND/OSC + DC
STM
Piezo Cap
(–)
(+)