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T

T

T

S

S

S

6

6

6

0

0

0

G

G

G

S

S

S

S

S

S

D

D

D

2

2

2

5

5

5

D

D

D

-

-

-

M

M

M

 

 

 

T

T

T

S

S

S

1

1

1

2

2

2

0

0

0

G

G

G

S

S

S

S

S

S

D

D

D

2

2

2

5

5

5

D

D

D

-

-

-

M

M

M

 

 

 

2.5” Solid State Drive

 

Transcend Information Inc.

 

 Preliminary V1.0 

13

Selective self-test log structure 

 

SMART Write Log Sector (subcommand D6h) 

This command writes 512 bytes of data to the specified log sector. LBA Low and Sector Count registers shall be set to 

specify the log address and sector number to be written. 

SMART Enable Operations (subcommand D8h) 

This subcommand enables access to all SMART capabilities. Prior to receipt of a SMART Enable Operations 

subcommand, Attribute Values are neither monitored nor saved by the device. The state of SMART—either enabled or 

disabled—will be preserved by the device across power cycles. Once enabled, the receipt of subsequent SMART 

Enable Operations subcommands will not affect any of the Attribute Values. 

SMART Disable Operations (subcommand D9h) 

This subcommand disables all SMART capabilities. After receipt of this subcommand the device disables all SMART 

operations. Non self-preserved Attribute Values will no longer be monitored. The state of SMART—either enabled or 

disabled—is preserved by the device across power cycles. Note that this subcommand does not preclude the device's 

power mode attribute auto saving. 

After receipt of the SMART Disable Operations subcommand from the host, all other SMART subcommands except 

SMART Enable Operations are disabled and will be aborted by the device returning the error code as specified in 

“SMART Error Codes”. 

Any Attribute Values accumulated and saved to volatile memory prior to receipt of the SMART Disable Operations 

command will be preserved in the device's Attribute Data Sectors. If the device is re-enabled, these Attribute Values will 

be updated, as needed, upon receipt of a SMART Read Attribute Values or a SMART Save Attribute Values command. 

Summary of Contents for TS120GSSD25D-M

Page 1: ...r high end system such as server and storage system Build in advance ECC and global wear leveling provide a durable solution is perfect replacement storage device for Server systems Storage systems PC...

Page 2: ...5 pins combo connector Environmental Specifications Operating Temperature 0 to 70 Storage Temperature 40 to 85 Performance Model P N Sequential Read Max Sequential Write Max TS60GSSD25D M 210 MB s 150...

Page 3: ...MTBF 1 5M hours Endurance 60GB 75 7 years 20GB write day 120GB 151 4 years 20GB write day Vibration Operating 5 0G 15 800Hz Non Operating 5 0G 15 800Hz Note Reference to the IEC 60068 2 6 Testing proc...

Page 4: ...D M M M T T TS S S1 1 12 2 20 0 0G G GS S SS S SD D D2 2 25 5 5D D D M M M 2 5 Solid State Drive Transcend Information Inc Preliminary V1 0 4 Package Dimensions Below figure illustrates the Transcend...

Page 5: ...D D D2 2 25 5 5D D D M M M 2 5 Solid State Drive Transcend Information Inc Preliminary V1 0 5 Pin Assignments Pin No Pin Name Pin No Pin Name 01 GND 02 A 03 A 04 GND 05 B 06 B 07 GND 08 NC 09 NC 10 NC...

Page 6: ...S SD D D2 2 25 5 5D D D M M M 2 5 Solid State Drive Transcend Information Inc Preliminary V1 0 6 Block Diagram Flash Flash Flash Flash Flash Flash Flash Flash Flash Flash Flash Flash Flash Flash Flas...

Page 7: ...veling When the free blocks erase count is higher than the data blocks it will activate the static wear leveling replacing the not so frequently used user blocks with the high erase count free blocks...

Page 8: ...6 60 0 0G G GS S SS S SD D D2 2 25 5 5D D D M M M T T TS S S1 1 12 2 20 0 0G G GS S SS S SD D D2 2 25 5 5D D D M M M 2 5 Solid State Drive Transcend Information Inc Preliminary V1 0 8 Supported ATA Co...

Page 9: ...subcommand sets In order to select a subcommand the host must write the subcommand code to the device s Features Register before issuing the SMART Function Set command The subcommands are listed belo...

Page 10: ...dated Attribute Values to the device s Attribute Data sector regardless of the state of the Attribute Autosave feature SMART Execute Off line Immediately subcommand D4h This subcommand causes the devi...

Page 11: ...G GS S SS S SD D D2 2 25 5 5D D D M M M T T TS S S1 1 12 2 20 0 0G G GS S SS S SD D D2 2 25 5 5D D D M M M 2 5 Solid State Drive Transcend Information Inc Preliminary V1 0 11 Error log data structure...

Page 12: ...ough 20 The data structure contains the descriptor of the Self test that the device has performed Each descriptor is 24 bytes long and the self test data structure is capable to contain up to 21 descr...

Page 13: ...will not affect any of the Attribute Values SMART Disable Operations subcommand D9h This subcommand disables all SMART capabilities After receipt of this subcommand the device disables all SMART oper...

Page 14: ...F8h Enable Automatic Off line A value of zero written by the host into the device s Sector Count register before issuing this subcommand shall cause the automatic off line data collection feature to...

Page 15: ...ice shall determine loss of signal as represented by a transition from PHYRDY to PHYRDYn which is associated with entry into states LSI NoCommErr or LS2 NoComm within the Link layer Note that negation...

Page 16: ...00h Reserved 49 2F00h Capabilities 50 4000h Capabilities 51 52 0200h PIO Mode support 53 0007h Reserved 54 3FFFh Number of current logical cylinders 55 0010h Number of current logical heads 56 003Fh N...

Page 17: ...required for security erase unit completion 90 0000h Time required for Enhanced security erase completion 91 0000h Current advanced power management value 92 0000h Master Password Revision Code 93 00...

Page 18: ...duct Transcend reserves the right to make changes to the specifications at any time without prior notice USA Los Angeles E mail sales transcendusa com Maryland E mail sales_md transcendusa com www tra...

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