T
T
T
S
S
S
6
6
6
0
0
0
G
G
G
S
S
S
S
S
S
D
D
D
2
2
2
5
5
5
D
D
D
-
-
-
M
M
M
T
T
T
S
S
S
1
1
1
2
2
2
0
0
0
G
G
G
S
S
S
S
S
S
D
D
D
2
2
2
5
5
5
D
D
D
-
-
-
M
M
M
2.5” Solid State Drive
Transcend Information Inc.
Preliminary V1.0
7
Reliability
Wear-Leveling algorithm
The controller supports static/dynamic wear leveling. When the host writes data, the controller will find and use the block
with the lowest erase count among the free blocks. This is known as dynamic wear leveling. When the free blocks' erase
count is higher than the data blocks', it will activate the static wear leveling, replacing the not so frequently used user
blocks with the high erase count free blocks.
ECC algorithm
The controller use Reed Solomon code or BCH code option
Reed Solomon: 6Bytes/sector for 128Bytes spare and 12Bytes/sector for 218Bytes spare
BCH: 8 or 12 bits/sector for 128Bytes spare and 16bits/sector for 218Bytes spare size
Bad-block management
When the flash encounters ECC failed, program fail or erase fail, the controller will mark the block as bad block to
prevent the used of this block and caused data lost later on.
