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90/10 rise time

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Setup

3

SLVUAN6 – June 2016

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TPD1E0B04 Evaluation Module

Figure 1. Ideal Contact Discharge Waveform of the Output Current of the ESD Simulator at 4-kV

3

Setup

This section describes the intended use of the EVM. A generalized outline of the procedure given in IEC
61000-4-2 is described here. IEC 61000-4-2 must be referred to for a more specific testing outline. Basic
configurations for collecting s-parameters and ESD clamping waveforms are outlined as well.

3.1

IEC 61000-4-2 ESD Rating Tests

TPD1E0B04 (D1 – D5) can be used for destructive electrostatic discharge (ESD) pass or fail strikes.
Specifically, they can be used for both IEC 61000-4-2 air and contact discharge tests. The procedure in

Section 3.1.1

ensures proper testing setup and method for both discharge tests. Each IO has a Test Pad

(TP1 – TP5) directly connected to it for striking ESD.

3.1.1

Test Method and Set-Up

An example test setup is shown in

Figure 2

. Details of the testing table and ground planes can be found in

the IEC 61000-4-2 test procedure. Ground the EVM using the banana connector J3. Discharge the ESD
simulator on any of the test points TP1 – TP5. Contact and air-gap discharge are tested using the same
simulator with the same discharge waveform. While the simulator is in direct contact with the test point
during contact, it is not during air-gap.

Summary of Contents for TPD1E0B04

Page 1: ...is This user s guide includes setup instructions schematic diagrams a bill of materials and printed circuit board layout drawings for the evaluation module Contents 1 Introduction 2 2 Definitions 2 3...

Page 2: ...as not to damage the oscilloscope A proper procedure is outlined in Section 3 3 1 2 Definitions Contact Discharge a method of testing in which the electrode of the ESD simulator is held in contact wi...

Page 3: ...00 4 2 ESD Rating Tests TPD1E0B04 D1 D5 can be used for destructive electrostatic discharge ESD pass or fail strikes Specifically they can be used for both IEC 61000 4 2 air and contact discharge test...

Page 4: ...SD protection diode shifts 0 1 V or leakage current increases by a factor of ten then the device is permanently damaged by ESD 3 2 Scattering Parameters A TPD1E0B04 D6 is configured with 2 SMA J1 and...

Page 5: ...the oscilloscope attenuation of the measured signal is required Here is a procedure for testing D3 1 Ground the EVM using the banana connector J3 2 Attach two 10X attenuators in series to the oscillos...

Page 6: ...rated TPD1E0B04 Evaluation Module 4 Board Layout This section provides the TPD1E0B04EVM board layout TPD1E0B04EVM is a 4 layer board of FR408HR at 0 062 inch thickness Layers 2 3 and 4 are ground plan...

Page 7: ...Table 3 Bill of Materials Count RefDes Description Package Reference Part Number MFR 6 D1 D2 D3 D4 D5 D6 1 Channel ESD Protection Device for Super Speed up to 6 Gbps Interface DPL0002A DPL0002A TPD1E0...

Page 8: ...sponsible for compliance with all legal regulatory and safety related requirements concerning its products and any use of TI components in its applications notwithstanding any applications related inf...

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