0
10
20
30
0
20
40
60
80
100
C
urrent
(A)
Time (ns)
I
PEAK
90%
I
PEAK
10%
I
PEAK
800
ps
90/10 rise time
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Setup
3
SLVUAN6 – June 2016
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Copyright © 2016, Texas Instruments Incorporated
TPD1E0B04 Evaluation Module
Figure 1. Ideal Contact Discharge Waveform of the Output Current of the ESD Simulator at 4-kV
3
Setup
This section describes the intended use of the EVM. A generalized outline of the procedure given in IEC
61000-4-2 is described here. IEC 61000-4-2 must be referred to for a more specific testing outline. Basic
configurations for collecting s-parameters and ESD clamping waveforms are outlined as well.
3.1
IEC 61000-4-2 ESD Rating Tests
TPD1E0B04 (D1 – D5) can be used for destructive electrostatic discharge (ESD) pass or fail strikes.
Specifically, they can be used for both IEC 61000-4-2 air and contact discharge tests. The procedure in
Section 3.1.1
ensures proper testing setup and method for both discharge tests. Each IO has a Test Pad
(TP1 – TP5) directly connected to it for striking ESD.
3.1.1
Test Method and Set-Up
An example test setup is shown in
Figure 2
. Details of the testing table and ground planes can be found in
the IEC 61000-4-2 test procedure. Ground the EVM using the banana connector J3. Discharge the ESD
simulator on any of the test points TP1 – TP5. Contact and air-gap discharge are tested using the same
simulator with the same discharge waveform. While the simulator is in direct contact with the test point
during contact, it is not during air-gap.