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Setup

5

SLVUAN6 – June 2016

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Copyright © 2016, Texas Instruments Incorporated

TPD1E0B04 Evaluation Module

3.3.1

Oscilloscope Setup

Without a proper procedure, capturing ESD clamping waveforms exposes the oscilloscope to potential
voltages higher than the rating of the equipment. Proper methodology can mitigate any risk in this
operation.

Recommended Measurement Equipment:

One 2-GHz bandwidth (minimum of 1 GHz) oscilloscope.

Two 10X 50-

attenuators

One 50-

shielded SMA cable.

Procedure

In order to protect the oscilloscope, attenuation of the measured signal is required. Here is a procedure for
testing D3:

1. Ground the EVM using the banana connector J3.

2. Attach two 10X attenuators in series to the oscilloscope channel being used.

3. Attach the 50-

shielded SMA cable between J2 and the attenuators.

4. Set the scope attenuation factor to 100X.

5. Set the oscilloscope to trigger on a positive edge for (+) ESD and a negative edge for (–) ESD strikes.

The trigger voltage magnitude must be set to 20 V.

6. Following

Section 3.1.1

, strike contact ESD to J1.Pin1.

Recommended settings for the time axis is 20 ns/div and for the voltage axis is 10 V division.

The voltage levels of the ESD applied to J1.Pin1 must not exceed ±8 kV while capturing clamping
waveforms.

Summary of Contents for TPD1E0B04

Page 1: ...is This user s guide includes setup instructions schematic diagrams a bill of materials and printed circuit board layout drawings for the evaluation module Contents 1 Introduction 2 2 Definitions 2 3...

Page 2: ...as not to damage the oscilloscope A proper procedure is outlined in Section 3 3 1 2 Definitions Contact Discharge a method of testing in which the electrode of the ESD simulator is held in contact wi...

Page 3: ...00 4 2 ESD Rating Tests TPD1E0B04 D1 D5 can be used for destructive electrostatic discharge ESD pass or fail strikes Specifically they can be used for both IEC 61000 4 2 air and contact discharge test...

Page 4: ...SD protection diode shifts 0 1 V or leakage current increases by a factor of ten then the device is permanently damaged by ESD 3 2 Scattering Parameters A TPD1E0B04 D6 is configured with 2 SMA J1 and...

Page 5: ...the oscilloscope attenuation of the measured signal is required Here is a procedure for testing D3 1 Ground the EVM using the banana connector J3 2 Attach two 10X attenuators in series to the oscillos...

Page 6: ...rated TPD1E0B04 Evaluation Module 4 Board Layout This section provides the TPD1E0B04EVM board layout TPD1E0B04EVM is a 4 layer board of FR408HR at 0 062 inch thickness Layers 2 3 and 4 are ground plan...

Page 7: ...Table 3 Bill of Materials Count RefDes Description Package Reference Part Number MFR 6 D1 D2 D3 D4 D5 D6 1 Channel ESD Protection Device for Super Speed up to 6 Gbps Interface DPL0002A DPL0002A TPD1E0...

Page 8: ...sponsible for compliance with all legal regulatory and safety related requirements concerning its products and any use of TI components in its applications notwithstanding any applications related inf...

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