325
Figure 13. Aliasing Signal Caused by Inadequate Sampling Rate
ALIASED SIGNAL
ACTUAL SIGNAL
When sampling an analog signal, the Nyquist criterion must be used in order to reproduce the sampled data
with no loss of information. The Nyquist criterion requires that the sampling frequency must be greater than
twice that of the highest frequency to be sampled.
On the other hand, sampling the input signal at a much higher rate than its input frequency can reduce the
system throughput due to poor CPU utilization. Choose the sampling frequency carefully to obtain an
optimal solution.
The ADC1 takes 164 cycles to convert the analog input to a digital result. If the controller operates using
a system clock frequency of 5 MHz, the conversion will take 32.8
µ
s. The ADC1 module allows a
programmable sampling time depending on the system application. Allow 1
µ
s sampling time for each
kilohm of source impedance or a minimum of 1
µ
s for a low impedance source. Assuming the analog source
impedance is less than or equal to 1 kilohm for minimum sampling time (the sampling time is limited by
the instruction cycle time to set up the SAMPLE START bit; the minimum sampling time is 1.6
µ
s using
a 5 MHz SYSCLK). In that case, the ADC1 can convert an analog input in every 34.4
µ
s for a maximum
conversion rate of 29,069 conversions per second.
To meet the Nyquist criterion, the maximum frequency of the input signal must be limited to approximately
14 kHz.
In multi-sensor systems, the ADC1 uses time-multiplexing techniques to scan between inputs from various
sensors. When these techniques are used, the scan frequency must take into account the number of
channels, so that the ADC1 captures changes occurring at the fastest rate of interest for a given signal.
Analog Reference and Layout Considerations
We have discussed various techniques using signal conditioning and filtering to improve system accuracy.
It is important to observe that no filter is justifiable as a substitute for proper attention to layout and
shielding techniques. Rather, it is adjunct to them. Every effort should be made to keep noise out of the
*
Summary of Contents for TMS370 Series
Page 1: ...TMS370 Microcontroller Family Application Book 1996 8 Bit Microcontroller Family ...
Page 2: ...Printed in U S A February 1996 SPNA017 ...
Page 3: ...1996 Application TMS370 Microcontroller Family Book ...
Page 20: ...1 Part I Introduction ...
Page 21: ...2 ...
Page 22: ...3 Introduction Microcontroller Products Semiconductor Group Texas Instruments ...
Page 23: ...4 ...
Page 25: ...6 ...
Page 27: ...8 ...
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Page 81: ...62 ...
Page 82: ...63 Clear RAM Microcontroller Products Semiconductor Group Texas Instruments ...
Page 83: ...64 ...
Page 85: ...66 ...
Page 86: ...67 RAM Self Test on the TMS370 Microcontroller Products Semiconductor Group Texas Instruments ...
Page 87: ...68 ...
Page 89: ...70 ...
Page 90: ...71 ROM Checksum on the TMS370 Microcontroller Products Semiconductor Group Texas Instruments ...
Page 91: ...72 ...
Page 95: ...76 ...
Page 97: ...78 ...
Page 98: ...79 Bubble Sort With the TMS370 Microcontroller Products Semiconductor Group Texas Instruments ...
Page 99: ...80 ...
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Page 324: ...305 T1PWM Set Up Routines Microcontroller Products Semiconductor Group Texas Instruments ...
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Page 396: ...377 PACT Command Macros Microcontroller Products Semiconductor Group Texas Instruments ...
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Page 492: ...473 Part V External Memory Expansion Examples ...
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