MSP430x31x
MIXED SIGNAL MICROCONTROLLERS
SLAS165D − FEBRUARY 1998 − REVISED APRIL 2000
22
POST OFFICE BOX 655303
•
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
•
HOUSTON, TEXAS 77251−1443
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
JTAG, program memory
PARAMETER
TEST CONDITIONS
MIN
NOM
MAX
UNIT
f
TCK frequency
V
CC
= 3 V
DC
5
MHz
f
(TCK)
JTAG/Test
TCK frequency
V
CC
= 5 V
DC
10
MHz
R
(TEST)
JTAG/Test
Pullup resistors on TMS, TCK, TDI
(see Note 15)
V
CC
= 3 V/ 5 V
25
60
90
k
Ω
Fuse blow voltage, C versions (see Note 15)
V
CC
= 3 V/ 5 V
5.5
6
V
(FB)
JTAG/Fuse (see Note 16)
Fuse blow voltage, E/P versions
(see Note 17)
V
CC
= 3 V/ 5 V
11
12
V
I
(FB)
JTAG/Fuse (see Note 16)
Supply current on TDI/VPP to blow fuse
100
mA
t
(FB)
Time to blow the fuse
1
ms
V
P313, E313
Programming voltage, applied to TDI/VPP
11
11.5
13
V
V
(PP)
P315(S), E315
Programming voltage, applied to TDI/VPP
12
12.5
13
V
I
(PP)
Current from programming voltage source
70
mA
t
(pps)
EPROM (E) and OTP(P) −
versions only
Programming time, single pulse
5
ms
t
(ppf)
versions only
(see Note 18)
Programming time, fast algorithm
100
μ
s
P
n
(see Note 18)
Pulses for successful programming
4
100
Pulses
t
(erase)
EPROM (E)
Erase time wave length 2537 Å at 15 Ws/cm
2
(UV lamp of 12 mW/ cm
2
)
30
min
EPROM (E)
Write/erase cycles
1000
cycles
Data retention T
J
< 55
°
C
10
years
NOTES: 15. The TMS and TCK pullup resistors are implemented in all ROM(C) and EPROM(E) versions.
16. Once the JTAG fuse is blown no further access to the MSP430 JTAG/test feature is possible.
17. The voltage supply to blow the JTAG fuse is applied to TDI/VPP pin when fuse blowing is desired.
18. Refer to the Recommended Operating Conditions for the correct V
CC
during programing.
