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Debug Probes Hardware and Software
30
SLAU647L – July 2015 – Revised February 2018
Copyright © 2015–2018, Texas Instruments Incorporated
MSP Debuggers
5.7
MSP-FET430UIF Stand-Alone Debugger
The MSP-FET430UIF is a powerful debug probe for application development on MSP430 microcontrollers.
This is a legacy debugger being replaced by MSP-FET.
The MSP-FET430UIF provides a USB interface to program and debug the MSP430 devices in-system
through the JTAG interface or the pin-saving Spy-Bi-Wire (2-wire JTAG) protocol.
The MSP-FET430UIF development tool supports development with all MSP430 devices and is designed
for use with PCBs that contain MSP430 devices; for example, the MSP430 target socket boards.
Two different version of the MSP-FET430UIF are available, version 1.3 and version 1.4a. There are
limitations when using version 1.3. See
for more details.
Figure 22. MSP-FET430UIF Version 1.4a Top and Bottom
Views
Figure 23. MSP-FET430UIF Version 1.3 Top and Bottom
Views
5.7.1
General Features
The following features are provided by the MSP-FET430UIF debug probe.
Features:
•
Operating systems: OS X, Linux, Windows
NOTE:
OS X El Capitan is not supported using the MSP-FET430UIF.
•
Software configurable supply voltage between 1.8 V and 3.6 V at 100 mA
•
External voltage detection
•
Supports JTAG security fuse blow to protect code
•
Supports all MSP430 boards with JTAG header
•
Supports both JTAG and Spy-Bi-Wire (2-wire JTAG) debug protocols
•
Software breakpoints in flash, FRAM, and RAM support
•
Flash and FRAM programming support
•
Software field update is possible (enable new device support by in field firmware updates)
NOTE:
The MSP-FET430UIF version 1.3 does not support Spy-Bi-Wire connection for MSP430
devices with 1-µF capacitance on the reset line.