Custom Scan Mode
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DLPU016C – April 2014 – Revised April 2019
Copyright © 2014–2019, Texas Instruments Incorporated
Operating the DLP NIRscan EVM
Figure 3-4. Custom Scan Screen
The Custom Scan mode allows more flexibility than the Quick Scan mode by allowing the user to
change the configuration parameters for the scan. The parameters for the Custom Scan mode are:
•
Spectral range
: for faster scan times, sub-ranges of the total 1350- to 2450-nm range can be used.
The smaller the spectral range entered, the faster the scan. For a custom wavelength range, the
smaller wavelength must be located on the left and the larger on the right. All values must be
between 1350 nm and 2450 nm.
•
Number of wavelength points
: This number defines into how many wavelengths the spectral
range is divided. The minimum is 3 and the maximum is 1100. The included optical system has an
optical resolution of
≤
12 nm. Increasing the number of wavelength points such that the computed
digital resolution is much less than 12 nm reduces system throughput without much of an optical
resolution advantage.
•
Digital resolution
: This is an informational output field for the user. The calculated resolution is the
wavelength range divided by the number of wavelength points.
•
Number of scans to average
: This is the number of times the entire wavelength range is
repeatedly sampled. If the number in this field is 1, then the wavelength range entered is scanned
only one time. If the number 2 is entered, the wavelength range is scanned twice, one complete
scan after another. The average spectrum data for each wavelength is averaged with the data for
the same wavelength on subsequent scans.
