TESTBOY TV 450
Appendix C
74
Time delayed RCDs demonstrate delayed response characteristics. They contain
residual current integrating mechanism for generation of delayed trip out. However,
contact voltage pre-test in the measuring procedure also influences the RCD and it
takes a period to recover into idle state. Time delay of 30 s is inserted before performing
trip-out test to recover
S
type RCD after pretests and time delay of 5 s is inserted for
the same purpose for
G
type RCD.
Modification of the chapter 5.4.1
RCD type
Contact voltage Uc
proportional to
Rated
I
Δ
N
AC
,
G
1.05
×
I
Δ
N
AC
S
2
×
1.05
×
I
Δ
N
any
A
,
G
1.4
×
1.05
×
I
Δ
N
A
S
2
×
1.4
×
1.05
×
I
Δ
N
≥
30 mA
A
,
G
2
×
1.05
×
I
Δ
N
A
S
2
×
2
×
1.05
×
I
Δ
N
< 30 mA
Both models
B
2
×
1.05
×
I
Δ
N
B
S
2
×
2
×
1.05
×
I
Δ
N
any
Model TESTBOY TV 450 (Type B)
only
Table C.1: Relationship between Uc and I
Δ
N
Technical specifications remain the same.