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List Test Function
List test mode enables you to automatically test devices by creating and
executing a sequence of test steps using a single function. For example, you
could create a list test that contains 10 different steps using the CC function, or
a two step list using CV. You define each step limit, measurement ranges, dwell
time, slew rate and trigger mode then save this specific sequence as a list. The
external trigger mode can be used to sequence the test with other operations
and instrumentation. All listed data is stored in non-volatile memory with “.list” as
the file extension. This secures the data and makes it easy to store and edit
directly from the SDL front panel.
As shown in Figure 2-41, the load simulates the complex sequences of input
changes based on the list parameters that you create. The list function supports
CC, CV, CR, and CP modes.
Figure 2-41 List Test Function
Users can edit list files through the front panel or use a previously
created list. Here, we will use the CC mode as an example (other
modes are similar)
Operating steps
1. Connect device
Power on the instrument and connect the DUT and the channel input
terminals of the electronic load, as shown in Figure 2-2.
