ST SPC572LADPT100S, User Manual

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5.6 Test points
Several test points of different shape and functionality are scattered around the SPC572LADPT100S evaluation
board to allow easy access to MCU and reference signals. This chapter summarizes and describes the available
test points. Test points are listed and detailed in the following table.
Table 10. Test points
Test point Description Position
GT1 GND test point
A3
(1)
GT2 GND test point D3 (1)
GT3 GND test point C2 (1)
GT4 GND test point A1 (1)
GT5 GND test point D1 (1)
TP1 AGND test point C3 (1)
TP2 TRST test point (JTAG) A1 (1)
TP3 TCK test point (JTAG) A1 (1)
TP4 TMS test point (JTAG) A1 (1)
TP5 TDI test point (JTAG) A1
(1)
TP6 TDO test point (JTAG) A1
(1)
TP7 SIPI_TXN test point C2
(1)
TP8 SIPI_TXP test point C2
(1)
TP9 SIPI_RXN test point C2
(1)
TP10 SIPI_RXP test point
C2
(1)
TP11 J23A, QSH connector, pin10 (PA[5]) test point
A4
(1)
TP16 J23A, QSH connector, pin19 (PA[14]) test point
A4
(1)
TP17 J24B, QSH connector, pin210 (PD[6]) test point
C1
(1)
TP18 J24B, QSH connector, pin209 (PD[7]) test point
D1
(1)
TP19 J24B, QSH connector, pin183 (PF[13]) test point
C1
(1)
1. Refer to the Figure 10. SPC572LADPT100S mini module - top
UM3063
Test points
UM3063 - Rev 1
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