8. Drive Diagnostics
SONY AIT-1 Turbo drive SDX-470V series Ver. 1.0
8-7
Error Set 2 - Diagnostic Errors
02h
MAIN PROCESSOR ROM CHECK SUM TEST FAILURE
06h
MAIN PROCESSOR DESTURCTIVE RAM TEST FAILURE
07h
MAIN PROCESSOR NON DESTRUCTIVE RAM TEST FAILURE
11h
EEPROM CHECKSUM TEST FAILURE
12h
BUFFER RAM TEST FAILURE
14h
INTERNAL MESSAGE BUS TEST FAILURE
15h
DATA COMPRESSION DMA LINE TEST FAILURE
20h
MECHANISM CONTROLLER MICROPROCESSOR TEST FAILURE
25h
BOT SENSOR TEST FAILURE
26h
EOT SENSOR TEST FAILURE
27h
BOTH BOT/EOT SENSOR TEST FAILURE
8.2.7.
Diagnostic Tests Requiring Additional Parameters
The diagnostic tests which require additional information in the Parameter A, B & C bytes are:
02
Error Rate Test
43
Read Data Exerciser
Error Rate Test (02) Diagnostic Parameters
This test reads or writes the number of groups defined by the Group Count. Any RAW retries, C3 ECC retries and
Read/Write hard errors encountered during the test are reported in the Error Rate Log which may then be
examined to determine tape performance.
Table 8-5: Error Rate Test Data
Bit
Byte
7 6 5 4 3 2 1 0
0
Diagnostic Test Number (02h)
1
Loop Count
2
Test Pattern
BOT
RND
WRT
RD
NLR
3
(MSB)
4
Group Count
(LSB)
The Test Pattern and RND fields are only relevant if the test includes a write pass, otherwise their values are
ignored.
Test Pattern:
0 - all ZEROs
1 - All ones
2 - Alternating ones and ZEROs
3 - Rotating data bytes (0,1,2,…,255)
4 - Pseudo-random data
5 - Worst case (C6h) bytes
BOT:
0 - Space to EOD before beginning write test
1 - Rewind to BOT before beginning read or write test
RND:
0 - Randomizer is disabled during test
1 - Randomizer is enabled during test
WRT & RD control bits: The following table shows the operation of the Error Rate Test with different
combinations of the WRT & RD bits.