Advanced Industrial Automation
A New Glass Mode
Different reflections can be measured on the CMOS
Detecting transparent objects
When a light beam hits the surface of an object, a certain
amount of the light is reflected, some is transmitted through
the object and the rest is absorbed. In the case of transparent
materials such as glass, the ZS-L can obtain reflected light from
the top surface, from the middle and from the bottom section
of glass.
• Superior features for semiconductor wafer, glass and other
measurements requiring precision.
• An unprecedented stationary measurement precision
of 0.01 μm; the highest in this product class.
• Enables stable measurement of height and undulations
in transparent, coated glass on worktables. Menus let you
easily set the measurement conditions for a wide range
of glass to achieve stable measurements.
• Outstanding measurement stability and high-speed
response at submicron resolution enables measurement
of flat glass thickness during the production process.
ZS-LD20T/ZS-LD40T
The smart way to measure glass and mirror surfaces
Glass
Glass thickness
Glass gap
Set sensing directly
FUN (setting mode)
Direct setting with
function keys