NXP Semiconductors RDGD31603PHSEVM, User Manual

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NXP Semiconductors
UM11603
RDGD31603PHSEVM three-phase inverter reference design
Problem Evaluation Explanation Corrective action(s)
Check bit length of message sent There is SPIERR if SCLK does not
see a n*24 multiple of cycles
Use 24-bit message length for SPI
messages
Check CRC SPIERR faults if CRC provided in
sent message is not good
Use FlexGUI to generate commands
with valid CRC. The command can be
copied in binary or hexadecimal and
sent from another program.
SPIERR reported after SPI message
Check for sufficient dead time
between SPI messages
SPIERR fault bit is set when the time
between SPI messages (txfer_delay)
received is too short. Minimum
required delay time is 19 µs.
Check time between CSB rising edge
(old message end) and CSB falling
edge (new message start) during
normal SPI read, and ensure transfer
delay dead time check.
SPIERR can also be cleared in BIST.
VCCREGUV reported on startup Check VCCREG potential Caused by low VCC Clear VCCREGUV fault bit
(STATUS1).
Tune VCC-GNDISO potential with
power supply set resistor (5 kΩ
potentiometer).
Check HV domain is powered
correctly
Related to slow rise time of VCC
supply on HV domain, or failed VREF
regulator
Clear VREFUV bit (STATUS2).
Reset HV domain supply if fault bit
does not clear.
VREFUV reported on startup
Check VCC for undervoltage
condition
Low VCC is visible indirectly through
other HV domain faults
Tune VCC-GNDISO using 5 kΩ
potentiometer feedback
Check VEE level on suspect domain. If VEE level is not at desired negative
voltage it could cause excessive VCC
level.
Check Zener diode in power supply
circuit for proper value in setting VEE
level.
Clear VCCOV bit (STATUS1) to
continue.
VCCOV fault reported on startup
Check VCC-GNDISO potential PWM is disabled during a VCC
overvoltage (20 V nom.)
Tune VCC-GNDISO potential to
suitable level with power supply set
resistor (5 kΩ potentiometer).
Clear VCCOV bit (STATUS1) to
continue.
No PWM during short circuit test Check PWMxSEL jumpers Incorrect configuration of PWMALT
pins prevent short-circuit test by
enforcing dead time
For short-circuit test, set PWMLSEL
(J9) and PWMHSEL (J10) to bypass
dead time.
Check VSUP/VDD for undervoltage
condition
VDD_UV latches SPI buffer contents,
preventing updated fault reporting.
Check voltage provided at VDD pin
(pin 3).
On each read, compare the address
from the sent command and response
(a difference indicates that the SPI
response is latched due to inactive).
Read multiple addresses to ensure a
good comparison.
Check PS_EN is set to HIGH in
FlexGUI; see Figure 21
VCC/VEE can be enabled/disabled in
software.
Enable VCC/VEE from FlexGUI
Bad SPI data, appears to repeat
previous response
Check VCC for undervoltage Unpowered VCC prevents HV domain
from updating data
Tune VCC-GNDISO using 5 kΩ
potentiometer feedback
UM11063 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2021. All rights reserved.
User manual Rev. 1 — 18 August 2021
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