NXP Semiconductors KITFS85SKTEVM, User Manual, Page: 45 / 50

NXP Semiconductors
UM11183
KITFS85SKTEVM evaluation board
UM11183 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2019. All rights reserved.
User guide Rev. 2.0 — 20 February 2019
45 / 50
8.4.9 TestMode:Sequencer
The sequencer allows you to display the slot configuration for the device. To be able to
access this tab, the device has to be in Test mode. The configuration is read from mirror
register. It is possible to modify it and update the mirror register.
As an example, the slot sequence is filled at start up with the content of OTP fuses. Then
the user can decide to modify any of the configurations coming from the OTP fuse. Note
that all these actions are done with Debug pin at 5.0 V and in test mode.
Figure 39. TestMode:Sequencer
Use the drop-down button (see Figure 40 ) to select the appropriate slot. The selection
configuration can be sent to the device by clicking Write button. The current status can
be read by using Read button.
Figure 40. Slot management