CCS Technical Documentation
Troubleshooting - Baseband
RH-34
Issue 1 11/2003 Confidential
©
2003
Nokia Corporation
Page 39
Phone is jammed
Phone is
jammed
Phone is
jammed,
page 2
Measure VIO,
VCORE, VFlash1,
VANA, and VR3
voltages. Are they
OK?
Measure 32kHz
Sleep Clk from test
point J974 and J975.
Is it OK?
Measure 19.2MHz RF
Clk at test point
C524. Is it OK?
Measure PURX
(TP16) and SleepX
(TP10). Are they high
(1.8V)?
Measure 32kHz Clk
crystal. Is it OK?
Change B200
Reflow or change
UEM
Measure 19.2MHz
Clk coming from
VCTCXO at C502. Is
it OK?
Check G503, C505,
C520, C503, R511,
R512, R518, R553. If
OK, change G501.
Change UPP
Change UEM
Check VBATT, VIO,
VCORE, VFlash1,
VANA, VR3
capacitors. Are they
OK? (See phone top
view diagram for
capacitor locations)
Check BSI/BTEMP
lines and VBATT
lines. If OK, change
UEM
Repair
NO
YES
NO
YES
NO
NO
YES
YES
YES
NO
NO
YES
Check R517, R521,
and D527. Is it OK?
Is PURX
OK?
Is SleepX
OK?
Repair
Change UPP
YES
NO
YES
NO
NO
YES
NO
YES