1 Pre-and Post-Stress
Electrical Test
2 High Temperature
The measured and observed characteristics should satisfy the
Set the capacitor for 1000±12 hours at 150±3
℃
. Set for
Exposure (Storage)
specifications in the following table.
24±2 hours at room temperature, then measure.
Appearance
No marking defects
Capacitance
R1,R7,C7 : Within ±12.5%
Change
D.F.
R1,R7,C7 : 0.05 max.
I.R.
More than 10,000M
Ω or 500Ω
・
F
(Whichever is smaller)
3 Temperature Cycling
The measured and observed characteristics should satisfy the
Fix the capacitor to the supporting jig in the same manner and under
specifications in the following table.
the same conditions as (19). Perform the 1000 cycle test according
Appearance
No marking defects
to the four heat treatments listed in the following table. Set for 24±2
Capacitance
R1,R7,C7 :Within ±7.5%
hours at room temperature, then measure
Change
D.F.
R1,R7,C7 : 0.05 max.
I.R.
More than 10,000M
Ω or 500Ω
・
F
(Whichever is smaller)
・
Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10
℃
for one hour and then set
for 24±2 hours at room temperature.
Perform the initial measurement.
4 Destructive
No defects or abnormalities
Per EIA-469.
Phisical Analysis
5 Moisture Resistance
The measured and observed characteristics should satisfy the
Apply the 24-hour heat (25 to 65
℃
) and humidity (80 to 98%)
specifications in the following table.
treatment shown below, 10 consecutive times.
Appearance
No marking defects
Set for 24
±
2 hours at room temperature, then measure.
Capacitance
R1,R7,C7 : Within ±10.0%
Change
D.F.
R1,R7,C7 : 0.05 max.
I.R.
More than 10,000M
Ω or 500Ω
・
F
(Whichever is smaller)
6 Biased Humidity
The measured and observed characteristics should satisfy the
Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8kΩ resister)
specifications in the following table.
at 85±3
℃
and 80 to 85% humidity for 1000±12 hours.
Appearance
No marking defects
Remove and set for 24±2 hours at room temprature, then measure.
Capacitance
R1,R7,C7 : Within ±12.5%
The charge/discharge current is less than 50mA.
Change
D.F.
R1,R7,C7 : 0.05 max.
I.R.
More than 1,000M
Ω or 50Ω
・
F
(Whichever is smaller)
-
■
AEC-Q200 Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
AEC-Q200 Test Method
Specification.
Step
1
2
3
4
Temp.
(℃)
-55+0/-3
Room
Temp.
125+3/-0
(for R1,R7,C7)
Room
Temp.
Time
(min.)
15±3
1
15±3
1
One cycle 24hours
Hours
Initial measuremt
+10
- 2 ℃
Humidity
90～98%
Humidity
80～98%
Humidity
80～98%
Humidity
90～98%
Humidity
90～98%
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
Temperature
70
65
60
55
50
45
40
35
30
25
20
15
10
5
0
-5
-10
(℃)
JEMCGS-00479C
2
