Information Manual
DSP1611/17/18/27/28/29 DIGITAL SIGNAL PROCESSOR
April 1998
JTAG Test Access Port
Lucent Technologies Inc.
DRAFT COPY
11-15
11.3 Elements of the JTAG Test Logic
(continued)
11.3.4 The Boundary-Scan Register—JBSR (continued)
With the different boundary-scan register cell types in mind,
show cell interconnec-
tions for a 3-state output pin and for a bidirectional pin.
Note: In the DSP1611/17/18/27/28/29, all output pins are 3-statable.
5-4208
Figure 11-8. Cell Interconnections for a Bidirectional Pin
DO
DI
HOLI
PO
PI
SO
PIN
OUTPUT
PIN
INPUT
BIDIRECTIONAL
PIN
B CELL
DC CELL
OEI
POE
HOLI
SO
SI
SI
PIN BIDIRECTIONAL
ENABLE
INPUT TO
CHIP
OUTPUT FROM
CHIP
BIDIRECTIONAL
ENABLE
FROM CHIP
FROM PREVIOUS
CELL
TO NEXT CELL
Summary of Contents for DSP1611
Page 18: ...Chapter 1 Introduction...
Page 27: ...Chapter 2 Hardware Architecture...
Page 52: ...Chapter 3 Software Architecture...
Page 116: ...Chapter 4 Instruction Set...
Page 154: ...Chapter 5 Core Architecture...
Page 176: ...Chapter 6 External Memory Interface...
Page 208: ...Chapter 7 Serial I O...
Page 237: ...Chapter 8 Parallel I O DSP1617 Only...
Page 261: ...Chapter 9 Parallel Host Interface PHIF DSP1611 18 27 28 29 Only...
Page 275: ...Chapter 10 Bit I O Unit...
Page 284: ...Chapter 11 JTAG Test Access Port...
Page 306: ...Chapter 12 Timer...
Page 313: ...Chapter 13 Bit Manipulation Unit...
Page 325: ...Chapter 14 Error Correction Coprocessor DSP1618 28 Only...
Page 350: ...Chapter 15 Interface Guide...
Page 367: ...Appendix A Instruction Encoding...
Page 379: ...Appendix B Instruction Set Summary...
Page 381: ...aD extractz aS IM16 B 52 aD insert aS arM B 53 aD insert aS IM16 B 54 aD aS aaT B 55...
Page 437: ...Index...