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LANGER 

EMV-Technik 

DE-01728 Bannewitz  
[email protected] 
www.langer-emv.com 

ESA1 

5  Safety instructions 

This  product  is  conformed  to  the  requirements  of  the  following  European  Union  regulations: 
2004/108/EG (EMC Directive) and 2006/95/EG (low-voltage directive). 
When  using  a  product  from  LANGER  EMV-Technik  GmbH,  please  observe  the  following  safety 
instructions to protect yourself from electric shocks or the risk of injuries. 

Read and follow the manual instructions and keep them in a safe place for later consultation. The 
device may only be used by personnel who are qualified in the field of EMC  and who are able to 
work under the influence of disturbance voltages and (electric and magnetic) burst fields.  

 Observe the operating and safety instructions for all devices used in the set-up. 

 Never use any damaged or defective devices. 

 Carry out a visual check before using a measurement set-up with a Langer EMV-Technik 

GmbH product. Replace any damaged connecting cables before starting the product. 

 Never leave a Langer EMV-Technik GmbH product unattended while this is in operation. 

 The Langer EMV-Technik GmbH product may only be used for its intended purpose. Any 

other use is prohibited. 

 People with pace-makers are not permitted to work with this device. 

 In principle, the test set-up should always be operated via a filtered power supply. 

Attention!  Functional  near  fields  and  interference  emissions  may  occur  when  operating 
Pulse-  and  RF  generators  or  in  connection  with  field  sources. The  user  is  responsible  for 
taking  measures  to  protect  the  correct  function of  products  outside  the  EMC  environment 
of the test set-up (in particular against interference). 

This can be achieved by: 

 

observing an appropriate safety distance 

 

using shielded or shielding rooms. 

Attention! Measuring devices may be destroyed due to the simultaneous use of Pulse- / RF 
generators and meas

uring devices, e.g. oscilloscope and spectrum analyzer. It is the user’s 

responsibility to prevent damage from these instruments. 

Protect measuring devices by: 

 Preconnection of filters in signal and supply lines  

 Using shielded lines 

 Shielding measuring devices 

The shielding has to be done with highest care! One gap at a single spot can lead to the loss of the 
whole shielding system effect! 

The disturbances that are injected into the assemblies can functionally destroy (latch-up) 
the device under test if their intensity is too high. 

Protect the device under test by: 

 preconnecting a protective resistor in the IC power supply 

 increasing the disturbance step by step, stopping when a functional fault occurs 

 interrupting the power supply to the device under test in the event of a latch- up 

Attention!  Make  sure  that  internal  functional  errors  are  visible  from  outside.  The  device 
under  test  may  be  destroyed  due  to  an  increase  in  the  injection  intensity  if  the  errors  are 
not visible outside. 

Take the following measures if necessary:

 

 

monitoring of representative signals in the device under test 

 

special test software 

 

visible reaction of the device under test to inputs (reaction test of the device under test) 

We cannot assume any liability for the destruction of devices under test! 

 

Summary of Contents for ESA1

Page 1: ...r Manual Development System Disturbance Emission ESA1 Measuring disturbances emitted by a module comparative measurements at the developer s workplace Copyright C Dipl Ing Gunter Langer N thnitzer Han...

Page 2: ...ar field probes 14 3 5 Modification of the module 15 4 Measurement set up variants 16 4 1 Measurement of the common mode component 16 4 1 1 Unit under test with one cable terminal 16 4 1 2 Unit under...

Page 3: ...stem of the unit under test is excited through electric or magnetic coupling i e in the near field This metal system comprises the PCB itself and all connected cables and metal parts such as housings...

Page 4: ...well as the output of the latter Figure 2 Figure 2 GP 23 Ground Plate The nickel plated surface ensures a steady and reliable conductive connection to the HFW 21 RF current transformer or HFA 21 RF by...

Page 5: ...the immediate vicinity of the unit under test is possible because all cables to the unit under test are disconnected coupled to the base plate through capacitive coupling or filtered in a typical ESA1...

Page 6: ...ft and right side of the shielding material against the ground plate An uninterrupted connection between the ground plate and shielding material is crucial for an effective shielding Figure 6 Z23 1 sh...

Page 7: ...e currents flowing on both lines whereas the differential mode currents are measured via the DIFF output The RF output voltage is independent of the direct current flowing through the transformer if c...

Page 8: ...s It is mainly used to simulate the data lines connected in normal operation and their capacitance relative to the surroundings Instead of the data line a discrete capacitance is connected to the sign...

Page 9: ...d measured by the probe and typical examples for application Optionally available The near field probes of the LF type are available for measurements in the frequency range between 100 kHz and 50 MHz...

Page 10: ...of the ground plate Inside the shielding tent connect the 12 V input of the PA 203 to the 3 5 mm connector on the ground plate via the enclosed power supply cable approx 10 cm long two power supply p...

Page 11: ...ly emitted This information allows you to design a measurement set up so that the decisive emitted currents can be measured To confirm the measurement set up compare your measurement results with the...

Page 12: ...re gridlines allow the developer to compare measurement curves very precisely in the linear or logarithmic 2D diagram Figure 18 Data Manager 2 Storage and export of measured data Any amount of measure...

Page 13: ...evices can also be stored in configuration files and reloaded 3 3 Localization through global changes to the unit under test The unit under test often allows you to locate the emission sources by chan...

Page 14: ...0 1 for magnetic and the probe RF E 02 for electric fields These measurements give you an idea of the respective disturbance emission mechanism As a next step locate the sources of these exciting fiel...

Page 15: ...ed damping or the lines of force are kept in the immediate vicinity of the source and do not exit the module Having detected the potential disturbing fields on the module you will automatically have i...

Page 16: ...r test is installed near a metal surface control system in a washing machine simulate this distance The scope of delivery includes a foam block 25 mm high which you can use as a distance piece Figure...

Page 17: ...nk to the ground plate Establish a direct conductive connection from the GND terminal of the plug and socket connector to the ground plate instead of the cable in the simplest case Figure 24 You can a...

Page 18: ...nd those of the basic unit 1 Plug and socket connector between basic unit and interface module Assumption The basic unit and interface module are connected to each other via data and control lines The...

Page 19: ...ifications such as filters or changing the plug assignment are directly measurable Figure 28 GND of the interface module connected to the COM output of the HFW 21 2 Electronic components processor wit...

Page 20: ...module feeds a RF current into the signal wires of the data cable This current couples to the shield via the cable capacitance of signal wire shield and flows back to the GND of the interface module I...

Page 21: ...upply systems Figure 31 Set up without the basic unit 4 1 5 External data lines 1 Measuring the RF current on data lines To measure the RF current on data lines simulate the capacitance of the line co...

Page 22: ...ts via the DIFF port Figure 34 According to the disturbance emission mechanism described under chapter 1 this differential mode current does not result in any disturbance emissions But since it also f...

Page 23: ...th field sources The user is responsible for taking measures to protect the correct function of products outside the EMC environment of the test set up in particular against interference This can be a...

Page 24: ...manufacture either by repair or by delivery of replacement during the statutory warranty period This warranty is only granted on condition that the information and instructions in the user manual have...

Page 25: ...The probe head contains a magnetically active curb with a width of approx 0 5 mm To achieve measurement the probe with the curb is positioned on conducting paths IC or capacitor connections Frequency...

Page 26: ...rface in question Due to its very small construction magnetic field distributions of under 1 millimeter can be resolved on IC housings and PCB surfaces for example The probe enables measurements in ha...

Page 27: ...C pins and small components Frequency 30 MHz to 3 GHz RF E 10 The near field probe detects electrical fields that clocked leads emit via their surface The probe head tip is approx 0 5 mm wide The inte...

Page 28: ...z 1 GHz DC socket 12 V 2 5 A 40 dB at 1 MHz 1 GHz Pole terminal 10 A 50 dB at 1 MHz 1 GHz 7 5 Z23 1 shielding tent Working room length x width x height Damping Z23 1 900 x 500 x 400 mm 45 50 dB at 30...

Page 29: ...3 GHz 1 11 H Field Probe RF R 400 1 30 MHz 3 GHz 1 12 H Field Probe RF U 2 5 2 30 MHz 3 GHz 1 13 H Field Probe RF U 5 2 30 MHz 3 GHz 1 14 E Field Probe RF E 02 30 MHz 1 5 GHz 1 15 E Field Probe RF E 0...

Page 30: ...Probe tip 1 33 ChipScan ESA software CS ESA 1 34 Dongle 1 35 User manual 1 36 Laminated quick guide 1 37 ESA1 system case 1 The shielding tent is alternatively available with a taller working space 90...

Page 31: ...nically processed either in its entirety or in part without the prior written permission of Langer EMV Technik GmbH The management of Langer EMV Technik GmbH assumes no liability for damage that may a...

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