Overview
1
Keysight E6961A User Guide and Method of Implementation
33
Slave TX_TCLK Jitter Test Information
specifies that the RMS value of the SLAVE TX_TCLK jitter
relative to an unjittered reference shall be less than 0.01 UI (Unit Interval)
after the receiver is properly receiving the data. This test measures the
data time interval error at the MDI. The ideal reference data rate is
selected automatically by the oscilloscope and compared to the original
signal to determine the data time interval error.
Alternatively, an external TX_TCLK could be used to measure the jitter.
Typical Waveform
Figure 1-15
Typical TX-TCLK Test Waveform (using a pair of SMA cables)