Section 3: LPTLib command reference
S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual
3-24
S530-900-01 Rev. E / September 2017
delay
This command provides a user-programmable delay in a test sequence.
Usage
int delay(unsigned int
n
);
n
The duration of the delay in milliseconds
Details
The
delay
command can be called anywhere in the test sequence.
Example
double ir4;
.
.
conpin(SMU1, 1, 0);
conpin(GND, 2, 0);
forcev(SMU1, 60.0); /* Generate 60 V from SMU1. */
delay(20); /* Pause for 20 ms. */
measi(SMU1, &ir4); /* Measure current; return */
/* result to ir4. */
This example measures the leakage current of a variable-capacitance diode. SMU1 applies 60 V across
the diode. This device is always configured in the reverse bias mode, so the high side of SMU1 is
connected to the cathode. Because this type of diode has very high capacitance and low leakage current,
a 20 ms delay is added. After the delay, current through SMU1 is measured and stored in the variable IR4.
Equation 4: Example of delay function
Also see
(on page 3-62)