S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual
Section 3: LPTLib command reference
S530-900-01 Rev. E / September 2017
3-83
Example
float idss[16];
.
.
conpin(SMU1, 2, 0);
conpin(GND, 5, 4, 3, 0);
limiti(SMU1, 1.5E-8);
rangei(SMU1, 2.0E-8); /* Select range for 20 nA. */
sintgi(SMU1, idss); /* Measure current with SMU1;*/
/* return results to idss. */
.
.
sweepv(SMU1, 0.0, 25.0, 15, /* Perform 16 measurements */
1.0E-3); /* (steps) from 0 through */
. /* 25 V; each step 1 ms in */
. /* duration. */
This example collects information on the low-level gate leakage current of a metal-oxide field-effect
transistor (MOSFET). Sixteen integrated measurements are made as the voltage is increased from 0 V to
25 V.
Also see
(on page 3-17)
(on page 3-26)