Innoventions RAMCHECK LX, Owner'S Manual

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4. RAMCHECK LX OPERATION RAMCHECK LX OWNER’S MANUAL
F1 to select SPEED.
Use the

and

keys to scroll through the available frequency rates.
When testing EDO/FPM modules, the speed override feature allows a “one
time” change of nanosecond access time from RAS. Enter the speed override
by pressing F2 during the Basic Test and select Speed.
Afterwards, use the

or

to position the cursor over the current speed and
then press either the

or

keys to increase or decrease the value. Press F1
to enter your selected speed.
Thereafter, subsequent test phases will be conducted at the selected speed, as
displayed on the screen with an "@" marker.
Please note that when modules are detected as being 3V devices (e.g.
SDRAM), RAMCHECK LX will not allow you to alter the voltage using the
changed-on-the-fly feature.
Next Phase:

If an error is detected, the defective bit(s) are identified and you can use
the various error menus to examine all the details of the error. Press
ESC to return to STANDBY mode. Before you press F1 to test your
next device, you can press
F4
to view the Test Log of the last DUT.
You can skip BASIC
test to reach the
EXTENSIVE test for
a DUT that fails
during the BASIC
test. See Section 5.

In the default RAMCHECK LX test flow, you cannot reach
EXTENSIVE and AUTO-LOOP tests unless the BASIC TEST has been
completed successfully.

If you do not elect to terminate the test procedure after BASIC test, the
following menu appears, prompting you to select the next test:
Press
F1
to go to EXTENSIVE test,
F2
to go to AUTO-LOOP. If 5
seconds pass with no user selection the EXTENSIVE test is initiated.

As always, ESC terminates the test. Before you press F1 to test your
next device, you can press F4 to view the Test Log of the last tested
DUT.
Significance of a Successful BASIC Test:
The BASIC test provides module type and speed information. It verifies
that all wiring on the module is sound and that all cells in the module are
operative. It also confirms basic refresh capabilities.
THE BASIC TEST
IS SUFFICIENT It may not detect intermittent and/or pattern sensitivity problems due to its
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