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Appx.
1
Appendix
Appx. 1 Measurement Principles
1. Insulation resistance measurement
The measuring object’s insulation resistance Rx is calculated by applying a
voltage V to the object, measuring the leak current I that flows to the object as
a result, and dividing the voltage V by the leak current I.
2.
Low resistance measurement (IR4056, IR4057-50)
The measuring object’s resistance Rx is calculated by applying a current I
to the measuring object, measuring the voltage V that occurs between the
measurement terminals as a result, and dividing the voltage V by the current I.
3. PV
Ω
measurement (IR4053, IR4055)
The resistance Rx is calculated using the equation (Applied voltage V)/
(Leakage current I) by applying a voltage V to the measuring object, and then
measuring the leakage current I flowing through the measuring object and
applied voltage V. (Voltage and current generated from the measuring object
are subtracted.)
Appendix
1
2
3
4
5
6
7
Appx.
索引
HIOKI IR4057B961-00
Summary of Contents for IR4053
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