Fujitsu MPG3102AT, Product Manual

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C141-E110-03EN 5 - 52
Table 5.8 Features Register values (subcommands) and functions (2/2)
X’D5’ SMART Read Logging Data:
This subcommand is used to transfer logging data of sectors specified in SC register
to the host.
The setting of SN register is described as the Log Sector Address below. When SN
register is set to 00h, 01h or 06h, SC register should be set to 01h. When SN register
is set to 80h-9Fh, SC register should be set to the maximum value shown in the Log
Directory.
Log Sector Address
00h: SMART Log Directory
(See Table 5.11)
01h: SMART Error Log
(See Table 5.12)
06h: SMART Self Test Log
(See Table 5.13)
80h-9Fh: Host vendor specific
When the device receives these subcommands, it asserts the BSY bit and transfers
logging data to the host, then clears the BSY bit.
X’D6’ SMART Write Logging Data:
The device receives the logging data of sectors specified in SC register from the host.
SN register should be set as the Log Sector Address below, and SC register should be
set to the maximum value shown in the Log Directory.
Log Sector Address
80h-9Fh: Host vendor specific
When the device receives these subcommands, it asserts the BSY bit and receives
logging data from the host, then clears the BSY bit.
X’D8’ SMART Enable Operations:
This subcommand enables the failure prediction feature. The setting is maintained
even when the device is turned off and then on.
When the device receives this subcommand, it asserts the BSY bit, enables the failure
prediction feature, then clears the BSY bit.
X’D9’ SMART Disable Operations:
This subcommand disables the failure prediction feature. The setting is maintained
even when the device is turned off and then on.
When the device receives this subcommand, it asserts the BSY bit, disables the
failure prediction feature, then clears the BSY bit.
X’DA’ SMART Return Status:
When the device receives this subcommand, it asserts the BSY bit and saves the
current device attribute values. Then the device compares the device attribute values
with insurance failure threshold values. If there is an attribute value exceeding the
threshold, F4h and 2Ch are loaded into the CL and CH registers. If there are no
attribute values exceeding the thresholds, 4Fh and C2h are loaded into the CL and
CH registers. After the settings for the CL and CH registers have been determined,
the device clears the BSY bit.
X’DB’ SMART Enable/Disable Automatic Off-line:
The device that receives this subcommand enables (SC register
≠
00h) or disables
(SC register = 00h) automatic off-line data collection. The condition is maintained
even when the device is turned off and turned on.
When the failure prediction feature and automatic off-line data collection are
enabled, an off-line data collection shall be performed regardless of host issued
command after more than 4 hours passed since power-on or the previous off-line data
collection.
When the device receives this subcommand, it asserts the BSY bit, enables or
disables automatic off-line data collection, then clears the BSY bit.