FDI LP3180, User Manual, Page: 26 / 40

FDI
NXP LPC3180 Demo
User’s Manual
FDI
Rev 2 Page 26 9/7/2007
Figure 11: I2C1 Test
After the test runs, the user may press the Enter key/OK button to return to the main
menu.
9.5 Test I2C2
This test is exactly like the I2C1 test outlined in the previous section. However, devices
are probed for at a different location, and devices should be found at different locations.
For this test, devices should be located at 0x34 and 0xE2.
9.6 Test SPI
The SPI1 and SPI2 tests are currently wrapped up into a single SPI test from the main
menu. This test verifies correct operation of the SPI bus by sending out a pattern which
may be observed using an oscilloscope.
The oscilloscope should be configured with a trigger value of 1V and 1ms/Div. The
ground may be connected to pin 20 of JTAG connector J4 as shown in Figure 12.
Figure 12 Oscilloscope Ground Connection
After selecting the test, place the probe on the right side of resistor R145 and press the
Space key/OK button to issue the test. A spike should be observed on the oscilloscope
output indicating successful communication across the SPI1 bus. If the spike is not
observed, verify the probe is on the resistor properly, and press the Space key/OK button
again to re-issue the test. This process should be repeated for R144. The locations of
these resistors are shown in Figure 13.