FDI LP3180, User Manual, Page: 24 / 40

FDI
NXP LPC3180 Demo
User’s Manual
FDI
Rev 2 Page 24 9/7/2007
9.0 Functional Tests
A group of functional tests are bundled with SIBL for verification and debugging
purposes on the LPC3180 board. This section describes these functional tests and shows
how they are useful in trouble-shooting the board. A list of the functional tests is
provided below:
1. LED Test
2. I2C Tests
3. SPI Tests
4. Uart2 to Bluetooth Test
5. Exhaustive Memory Test
9.1 Entering Functional Test Mode
To access the functional tests within SIBL, the F1 key should be pressed and held while
the power switch (SW1) is toggled. Alternatively if the GUI board is not present, the
space key may be tapped after observing the following text in HyperTerminal:
NXP LPC3180 Demo
FDI SIBL v1.00
SIBL will perform initialization and the quick memory test before going into Functional
Test Mode.
9.2 Functional Test Menu
Figure 9 shows the main menu listing all functional tests to choose from. The number
keys on the keyboard or GUI keypad may be used to make selections. The particular test
selected will be highlighted in white. For example, in Figure 9, functional test “2. Test
I2C1” is selected. After pressing the number of the test desired, the Enter key/OK button
should be pressed to enter the test.
Figure 9: Functional Tests Menu
Also, if using the GUI board, the up and down keys on either side of the ‘OK’ button may
be used to scroll through the tests.