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EM TEST EFT 500 Series, Manual For Operation

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EM TEST EFT 500 Series Manual For Operation Download Page 7

EM TEST

EFT 500 Series

Manual for Operation

V 2.00

7 / 21

2.4.

User Test Routines 

The user can program, save and recall his own specific test routines. The next pages shows the selection of the
functions.

USER TEST ROUTINES                          Page 1 / 2

USER TEST ROUTINES                          Page 2 / 2

F1 :  Customized test routines

F1 :  Change duration after T by 

∆

dt 

F2 :  Voltage change after T by 

∆

V

F2 :  Change polarity after T

F3 :  Frequency change after T by 

∆

f 

F3 :  Random burst release

F4 :  Frequency sweep in one single burst 

F4 :  Synchronized at fixed angle

Page 2

Page 1

F1

F2

F3

F4

F5

F6

F7

F1

F2

F3

F4

F5

F6

F7

Each of these special functions can include 7 stored test routines. 

CUSTOMISED TEST ROUTINES

F1 :  Store  F1                      F5 :  Store  F5
F2 :  Store  F2                      F6 :  Store  F6
F3 :  Store  F3                      F7 :  Store  F7
F4 :  Store  F4

F1

F2

F3

F4

F5

F6

F7

After selection of a stored test file the test parameters will be indicated on the display. 

Customized test routines 

The software controls standard test routines according to the specification of the user. All limitations are the same
as defined under Quick Start. 

Voltage change after T by 

∆

V 

The test voltage is increased from V1 to V2 by steps of 

∆

V

after the defined test time T. All limitations are the same as
defined under Quick Start. The limitation of the max.
generated number of spikes is related to the higher voltage
of V1 or V2. 

Frequency change after T by 

∆

f 

The spike frequency is increased from f1 to f2, and then
from f2 to f3 by steps of 

∆

f after the defined test time T. All

limitations are the same as defined under Quick Start. The
limitation of the max. generated number of spikes is related
to the higher frequency of f1 , f2 or f3. 

Summary of Contents for EFT 500 Series

Page 1: ...ilities a clearly arranged menu structure and display philosophy as well as the pre programmed standard test routines make testing easy reliable and safe Extendable by a variety of test accessories the EFT 500 is a universal equipment for abroad range of recommendations even for three phase applications up to 100A IEC 61000 4 4 IEC 61000 4 4 Ed 2 EN 61000 4 4 EN 61000 4 4 Ed 2 Version 2 00 15 07 2...

Page 2: ...eneration 11 3 3 Coupling decoupling network 12 3 3 1 Coupling decoupling network for ac dc power lines 12 3 3 2 Capacitive coupling clamp 12 3 4 Burst Test Setup 13 3 5 Computer setup for EFT Burst testing 14 4 Technical data 16 4 1 EFT Electrical Fast Transients Burst as per IEC 61000 4 4 16 5 Maintenance 17 5 1 General 17 5 2 Test set up 17 5 3 Calibration and verification 17 6 Delivery Groups ...

Page 3: ... reset of the firmware This is only possible if no test routine is running 7 ESC When pressing the ESC button the user moves back one page in the menu 8 BNC CRO Trigger At the BNC output the generator trigger can be checked e g the burst duration the burst repetition rate and the spike frequency 15 V rectangular This output signal can also be used to trigger external measuring devices e g an oscil...

Page 4: ...fety circuit To connect an external security circuit 7 Serial interface RS 232 interface with a 9 pole connector 8 Remote control connector CN To connect to the external coupling matrix CNE 503 All functions are controlled by the EFT 500 It is recommended to connect and power the CNE 503 before turning the power mains ON at the EFT 500 9 Parallel interface GPIB IEEE 488 IEEE 488 interface with IEE...

Page 5: ... Start up display example EFT 500 The serial number and the version number SWN are used for traceability reasons These numbers are listed in the test reports and calibration certificates These numbers also are listed within the test reports generated by the ISM ISO software 2 2 Main Menu MAIN MENU F1 Quickstart F2 User test routines F3 Standard test routines acc IEC 61000 4 4 F7 Service F1 F2 F3 F...

Page 6: ...r slow change Press START and the test starts immediately with the displayed test parameters The operator now can navigate with the Cursor from parameter to parameter The blinking parameter can be changed by turning the front panel knob Press ESC will bring the user back to the previous menu level Page 3 Change QUICKSTART Voltage V 200V 4400V Frequency f 0 1kHz 1000 0kHz Duration td 0 1ms 999 9ms ...

Page 7: ...6 F3 Store F3 F7 Store F7 F4 Store F4 F1 F2 F3 F4 F5 F6 F7 After selection of a stored test file the test parameters will be indicated on the display Customized test routines The software controls standard test routines according to the specification of the user All limitations are the same as defined under Quick Start Voltage change after T by V The test voltage is increased from V1 to V2 by step...

Page 8: ... T All limitations are the same as defined under Quick Start The limitation of the max generated number of spikes is related to the higher duration of t4s or t4e Random burst release No repetition rate is selected The single burst will be triggered randomly within the limits of 20 to 2000ms as time between two bursts All limitations are the same as defined under Quick Start Change coupling after T...

Page 9: ...lected test time T X Y Page 3 Show values Standard IEC 1000 4 4 Level 3 V 2000V f 100 kHz td 0 8ms tr 300ms kop L N PE T 1 00min The Standard defines the burst duration at 100kHz with 0 75ms The EFT 500 does not support a resolution of 0 05ms The burst duration at 100kHz is set to 0 8ms which is inside the specified tolerance of the standard of 0 75ms 20 F1 F2 F3 F4 F5 F6 The functions START CHANG...

Page 10: ...e backlighting after a specified time the generator has not been in operation 1 30min Interfaces This menu will help the user to define the status of the integrated serial and parallel interfaces e g the baud rate of the RS 232 or the address of the IEEE interface Keyboard Beeper F1 is the selector for the beeper ON OFF mode The beeper is always on when a test routine is finished To indicate that ...

Page 11: ...z t4 15ms 15ms t5 300ms 300ms 3 2 Burst generation Discharge switch The discharge switch is a highly reproducible semiconductor switch Spike frequencies up to 1000kHz are by a factor of 200 higher than recommended in the actual EFT standards This means of course that also the pulse energy would be 200 times higher This is not generally possible for the high voltage switch Therefore the following l...

Page 12: ...without interfering with the signal flow It is often impossible to contact the required circuit direct e g coaxial or shielded cables In this case the coupling is realized with the capacitive coupling clamp The interference simulator can be connected on both sides of the coupling clamp 3 3 2 Capacitive coupling clamp The coupling clamp is not matched by 50 ohm If the clamp is matched there exists ...

Page 13: ...EUT should only be grounded if this is recommended by the installation guideline For safety reasons the test without any ground connection should be conducted as well at 100MHz 1m ground cable has an impedance of about 600 ohm Whenever possible the test set up and the cabling should always be the same e g for testing power lines it would be possible to fix the cables on the test table for all test...

Page 14: ...o a system at the weakest part Within a computer controlled system the weakest unit is almost the computer with its interconnection lines and the peripheral equipment The most critical test concerning the above mentioned problems is the burst test according to IEC 1000 4 4 This is a high frequency test which may radiate extreme interference fields to the environment Concerning the test set up the ...

Page 15: ...t EMC concerns 2 Do not use notebooks for this application Laptops are fully manufactured within a plastic housing and therefore are very sensitive to all kind of interference 4 It would be better to use tower or mini tower equipment They are at least partially screened The interface connectors are mounted on metallic surfaces so that the screen of the communication lines can be connected to the c...

Page 16: ...ctor To connect ext coupling devices Coupling network To L N PE all combinations DUT power mains supply AC 250 V 16 A 50 60 Hz DC 250V 10A Test routines Quick Start Immediate start all parameters adjustable during a running test Standard test as per IEC 61000 4 4 level 1 level 5 Level X Level Y User test routines Customized test routines Voltage change after T by V Frequency change after T by f Fr...

Page 17: ...r can be operated individual as a single equipment 5 3 Calibration and verification The EM Test equipment are calibrated in the factory and marked with a calibration tag The measuring instrument is traceable to the Swiss Federal Office of Metrology The calibration date is marked The validity of the calibration is in the area of responsibility of the users quality system Example EM Test calibration...

Page 18: ...00 type KW 50 1000Ω matching resistor 1 1000 type KW 1000 Capacitive coupling clamp HFK as per IEC 61000 4 4 External coupling decoupling network 3 phase CNE 503 EUT mains supply 400 V rms max 480V for USA Nominal current In 16 A 32A 63A 100 A rms Frequency 50 60 Hz Coupling to all lines Lx N PE 50Ω Burst output The coupling will be controlled by the EFT 500 ITP immunity test probe set User softwa...

Page 19: ...993 Safety EMC Directive 89 336 EEC Standard s to which conformity is declared Emissions EN 50081 2 1992 EN 50022 1987 Class A EN 61000 2 3 A14 2000 Conducted and radiated Harmonics Immunity EN 50082 2 1995 EN 61000 4 2 1995 Electrostatic Discharges EN 50413 1993 RF Electromagnetic Field EN 61000 4 6 1997 Conducted RF EN 61000 4 4 1995 Electrical Fast Transient Burst EN 61000 4 5 1996 Surge EN 610...

Page 20: ...EM TEST EFT 500 Series Manual for Operation V 2 00 20 21 7 2 EFT 500 General Diagram 7 3 EFT 500 Overview ...

Page 21: ... Print Start test procedure Change Select the parameters Continue Save Store the parameters Print Set up Standard test routines F1 Level 1 250 V 5 100 kHz F2 Level 2 500 V 5 100 kHz F3 Level 3 1000 V 5 100 kHz F4 Level 4 2000 V 5 100 kHz F5 Level 5 4000 V 5 100 kHz F6 Level X Level Y Test level 1 5 x y F1 Start F2 Change F3 Continue F7 Print Test level 1 4 Start Start of the test routine Change Se...

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