CY7C1510KV18, CY7C1525KV18
CY7C1512KV18, CY7C1514KV18
Document Number: 001-00436 Rev. *E
Page 16 of 30
TAP AC Switching Characteristics
Over the Operating Range
[13, 14]
Parameter
Description
Min
Max
Unit
t
TCYC
TCK Clock Cycle Time
50
ns
t
TF
TCK Clock Frequency
20
MHz
t
TH
TCK Clock HIGH
20
ns
t
TL
TCK Clock LOW
20
ns
Setup Times
t
TMSS
TMS Setup to TCK Clock Rise
5
ns
t
TDIS
TDI Setup to TCK Clock Rise
5
ns
t
CS
Capture Setup to TCK Rise
5
ns
Hold Times
t
TMSH
TMS Hold after TCK Clock Rise
5
ns
t
TDIH
TDI Hold after Clock Rise
5
ns
t
CH
Capture Hold after Clock Rise
5
ns
Output Times
t
TDOV
TCK Clock LOW to TDO Valid
10
ns
t
TDOX
TCK Clock LOW to TDO Invalid
0
ns
TAP Timing and Test Conditions
Figure 2
shows the TAP timing and test conditions.
[14]
Figure 2. TAP Timing and Test Conditions
t
TL
t
TH
(a)
TDO
C
L
= 20 pF
Z
0
= 50
Ω
GND
0.9V
50
Ω
1.8V
0V
ALL INPUT PULSES
0.9V
Test Clock
Test Mode Select
TCK
TMS
Test Data In
TDI
Test Data Out
t
TCYC
t
TMSH
t
TMSS
t
TDIS
t
TDIH
t
TDOV
t
TDOX
TDO
Notes
13. t
CS
and t
CH
refer to the setup and hold time requirements of latching data from the boundary scan register.
14. Test conditions are specified using the load in TAP AC Test Conditions. t
R
/t
F
= 1 ns.
[+] Feedback
