TF570 SLI
33
C. Memory Integration Test (M.I.T.):
This f unction is under “Ov erclocking Nav igator Engine” item.
MIT allows users to test memory compatibilities, and no extra devices or
software are needed.
Step 1:
The def ault setting under this item is “Disabled”; the condition parameter should
be changed to “Enable” to proceed this test.
↓
Step 2:
Sav e and Exit f rom CMOS setup and reboot the system to activ ate this test.
Run this test for 5 minutes (minimum) to ensure the memory stability.
Step 3:
When the process is done, change the setting back from “Enable” to “Disable”
to complete the test.
