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MT9T111_DG - Rev. B 9/10 EN
70
©2007 Aptina Imaging Corporation. All rights reserved.
MT9T111: Developer Guide
Walking 1s Test Pattern
Preliminary
Walking 1s Test Pattern
The walking 1s test pattern meets the following requirements and conditions:
• The walking 1s test pattern will work in both preview and capture context (context A
and context B)
• The MT9T111 must run in high power mode with no gated pixel clock
• The part must be put into the SOC bypass mode
The output data is in RAW Bayer format
• The output resolution should be configurable
• The 8-bit pattern will use the same data bits as the YUV output
• The walking 1s test pattern is output only during active lines and frames, it is not
output during blanking period
The sequence is reset to start from “0” again, after the blanking
• The walking 1s test pattern is only available in parallel mode and not in MIPI mode
Figure 40:
Sample Operation on One Line
0x00
0x00
0x01
0x01
0x02
0x02
0x00
0xFF
0xFF
0x80
0x80
0x40
0x40
0x04
0x04
0x08
0x08
0x10
0x10
0x20
0x20
...
...
x000
x000
x001
x001
x002
0x02
x200
x100
x100
x080
x080
x040
x040
x004
x004
x008
x008
x010
x010
x020
x020
x200
...
...
x3FF
x3FF
x000
...
...
...
...
FV
LV
PIXCLK
D
OUT
[7:0]
FV
LV
PIXCLK
D
OUT
[7:0],
D
OUT
_LSb 1,
D
OUT
_LSb 0
10-Bit Walking 1s Output (RO)
8-Bit Walking 1s Output (RO)