UG-1820
Rev. 0 | Page 15 of 24
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26
27
28
29
30
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019
Figure 19.
Histogram
Tab of the
Software
HISTOGRAM TAB
The
Histogram
tab generates a histogram using the gathered
samples and processes the data to calculate the
P - P Noise
,
RMS Noise
, and resolutions (see Figure 19).
Histogram Graph and Controls
The data histogram graph (Label 25 in Figure 19) shows the
number of times each sample of the ADC output occurs. Zoom
in on the data using the control buttons (Label 26 in Figure 19)
in the graph. Change the scales on the graph by typing values
into the x-axis and y-axis.
Analysis Input
The data used to generate the histogram and values in the noise
analysis area (Label 27 in Figure 19) is set by the
Noise Analysis
box (Label 28 in Figure 19). All enabled inputs appear here in
the
Noise Analysis
box.
Noise Analysis
The noise analysis area (Label 27 in Figure 19) displays the
results of the noise analysis for the selected analysis input,
including both noise and resolution measurements.
Display Units and Axis Controls
Click the
Units: V/mV/A/mA
box in the
Graph Configuration
area (Label 29 in Figure 19) to select whether the data graph
displays in units of voltages, amps, or codes. This control is
independent for each graph.
The
Y-scale: Autoscale
and
X-scale: Autoscale
boxes can be set
to autoscale or fixed scaling. When
Autoscale
is selected, the
axis automatically adjusts to show the entire range of the ADC
results after each batch of samples. When
Fixed
is selected, the
user can set the axis range. These ranges do not automatically
adjust after each batch of samples.
Device Error
The
Device Error
indicator (Label 30 in Figure 19) illuminates
in the
Histogram
tab when a CRC error or an error in the ADC
is detected. More specific information on the error can be found
by clicking
Summary
in the
Configuration
tab (Label 11 in
