Agilent Technologies 81662A, User Manual, Page: 44 / 72

Performance Test Instructions Performance Tests
Agilent 81662A and 81663A DFB Laser Source Modules User’s Guide, Fifth Edition
43
Test Records
Performance Test for the Agilent 8166_A
Page 3 of 4
Test
Number
Test Description Minimum
Specification. Result
Maximum
Specification.
Measurement
Uncertainty
I Wavelength Repeatability nm nm
measured at ________nm
(-50 GHz offset frequency)
________ < (1)
measured at ________nm
(0 GHz offset frequency)
________ < (1)
measured at ________nm
(+50 GHz offset frequency)
________ < (1)
2 Wavelength Stability, 15min nm nm
measured at ________nm
(0 GHz offset frequency)
________ < (1)
(1): 0.006 nm for 81662A or 0.01 nm for 81663A
Repeatability of
∆
f = -50 GHz (= reference)
Measurement Result Repeatability of
∆
f = 0 GHz (= reference)
Measurement Result
Initial Setting REF = nm Initial Setting REF = nm
from -30 GHz to -50 Ghz nm from -30 GHz to -50 Ghz nm
from -10 GHz to -50 GHz nm from -10 GHz to -50 GHz nm
from 0 GHz to -50 GHz nm from 0 GHz to -50 GHz nm
from +10 GHz to -50 GHz nm from +10 GHz to -50 GHz nm
from +30 GHz to -50 GHz nm from +30 GHz to -50 GHz nm
from +50 GHz to -50 GHz nm from +50 GHz to -50 GHz nm
largest measured value nm largest measured value nm
smallest measured value nm smallest measured value nm
Wavelength Repeatability nm Wavelength Repeatability nm