02/25/00
Microsense II Model 5300 Gaging System - 17
Microsense Probes
Microsense noncontact probes allow precise positional measurement of stationary or moving surfaces.
Signals provided by the probe are processed by circuitry housed within the console to calculate surface
position and related parameters. Because the measurement is made without physical contact, probes are
prevented from damaging the examined surface or altering the parameter being measured.
Each probe consists of three distinct parts:
1) a tip which houses the sensor and associated circuitry
2) a driver circuit board mounted adjacent to the tip containing electronic circuitry
3) a 3-meter detachable cable which carries signals from the probe to the gaging console.
In order to accommodate a wide range of physical constraints, Microsense probes are available in a variety
of physical configurations (such as axial and blade).
The surface of the probe tip contains a sensor, insulated from the housing. During operation, the sensor is
mounted in close proximity to a target. This creates a capacitor, with the probe sensor and target surface
serving as its plates. The driver supplies a high-frequency voltage signal to the sensor. Circuitry in the
probe measures the capacitance and generates a current signal representing probe-to-target displace-
ment. The probe cable routes this signal from the probe to the console.
Probes are housed in stainless steel of sufficient strength to withstand forces inherent in proper fixturing.
Low profile probes have holes in their housing to accept mounting hardware. Careful probe handling is
required to avoid scratching the probe's sensing area.
Usage Diagram for Series 5000 Probes
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