![background image](http://html1.mh-extra.com/html/zeiss/axio-examiner/axio-examiner_operating-manual_3326798061.webp)
OPERATION
Axio Examiner
Illumination and contrast procedures
Carl Zeiss
M60-2-0003 e 05/2012
61
4.1.2
Transmitted-light differential interference contrast (DIC)
(1) General operating principle
The transmitted-light DIC procedure is a contrasting alternative for polarization applications, and allows
the high-contrast plastic representation of transparent specimen details.
Light polarized in a linear manner by a polarizer is split into two component beams in a birefringent
prism. These beams run through two neighboring specimen positions located at a small distance from
one another, and are subjected to different path differences brought about by differences in refractive
index and specimen thickness. Subsequently, both component beams are combined in a second
birefringent prism, and have the same oscillation direction after passing through the analyzer. This allows
interference of both component beams in the intermediate image while different path difference are
transposed into different grey values (intensities). A compensator
λ
(lambda plate) converts the grey
values into colors subsequently.
(2) Equipment
−
Objectives offered with DIC equipment, e.g., EC Plan-Neofluars.
−
DIC sliders suitable for the objectives used.
−
Condenser with revolving disk on which DIC prisms are located (DIC I, DIC II, DIC III).
−
Polarizer, e.g., SÉNARMONT polarizer.
−
DIC P&C analyzer module in the reflector turret.
−
Preferably a revolving mechanical stage.
For Axio Examiner microscopes not ordered with DIC equipment, DIC sliders must be inserted into
the objective exchange carriage or into the objective adapter, and set to a central position if any in
order to be able and carry out examinations using differential interference contrast. Step (3)
describes how to insert DIC sliders. Item (4) describes how to set their central position.
(3) Inserting DIC sliders
DIC sliders are already inserted and centered if your microscope equipment has been ordered for
applications using interferential difference contrast.
To retrofit or replace DIC sliders, please proceed as follows:
Содержание Axio Examiner
Страница 1: ...Operating Manual Axio Examiner Research Microscope...
Страница 13: ...INTRODUCTION Axio Examiner List of interfaces Carl Zeiss M60 2 0003 e 05 2012 13 Figure 1 2 List of interfaces...
Страница 19: ...EQUIPMENT DESCRIPTION Axio Examiner System overview Carl Zeiss M60 2 0003 e 05 2012 19 2 2 System overview...
Страница 20: ...EQUIPMENT DESCRIPTION Carl Zeiss System overview Axio Examiner 20 M60 2 0003 e 05 2012...
Страница 21: ...EQUIPMENT DESCRIPTION Axio Examiner System overview Carl Zeiss M60 2 0003 e 05 2012 21...
Страница 22: ...EQUIPMENT DESCRIPTION Carl Zeiss System overview Axio Examiner 22 M60 2 0003 e 05 2012...
Страница 96: ......