YUSHI LM-100 Скачать руководство пользователя страница 3

1.Principle of Leeb Hardness Testing Method

The impact body, which is equipped with tungsten carbide, impacts into the
work piece and rebounds back. The rebound and impact velocities are
measured at the 1mm point from the work piece in the following way: the
integrated permanent magnet will produce directly proportional voltage
with the impact velocity. The Leeb hardness values are calculated by the
following formula:

HL=1000×( V

b

/ V

a

)

In Which

HL: Leeb hardness values

V

b

: the voltage produced during the rebound of impact body

V

a

: the voltage produced during the impact of impact body

Figure 1 shows the voltage produced during the impact and rebound of
impact body:

voltage features of output signal

Figure 1.1

2. Instrument and Impact Device Diagram

2.1 Instrument Diagram

2.1

Figure 2.1

1

2

Содержание LM-100

Страница 1: ...Leeb Hardness Tester LM100 Operating Manual YUSHI INSTRUMENTS...

Страница 2: ...ss Requirements 9 4 1 3 Surface Hardened Layer Thickness 9 4 1 4 Curved Surface Requirement 9 4 2 Support of Test Piece 10 5 Operation 10 5 1 Display 10 5 2 Keyboard 11 5 3 Turn on the Instrument 11 5...

Страница 3: ...uce directly proportional voltage with the impact velocity The Leeb hardness values are calculated by the following formula HL 1000 Vb Va In Which HL Leeb hardness values Vb the voltage produced durin...

Страница 4: ...7 2g 7 8g 3 0g 20 0g 5 5g Test Tip Hardness 1600HV 1600HV 1600HV 1600HV 5000HV Test Tip Diameter 3mm 3mm 3mm 5mm 3mm Test Tip Material Tungsten Carbide Tungsten Carbide Tungsten Carbide Tungsten Carbi...

Страница 5: ...7 m 10 m Impact Device Applicable Scope DC Used for very confined spaces such as holes cylinders internal measurement DL Used for extremely confined spaces D 15 Used for measuring in grooves recessed...

Страница 6: ...D type impact device Standard Optional C G DC DL D 15 Accuracy 6HLD HLD 800 Repeatability 6HLD HLD 800 Measuring Direction Vertically downward inclined downward Level inclined upward vertically upwar...

Страница 7: ...ce to be tested is smaller than 30mm D DC D 15 C E and DL type of impact device and smaller than 50mm G type of impact device the small support ring or the special support rings should be selected 4 2...

Страница 8: ...e button to select the probes 5 4 4 Impact Direction Press DIR button to select impact direction Figure 5 4 5 4 5 Impact Times Press TIME button to set the impact times from 1 7 which will calculate t...

Страница 9: ...7 Data Save and Read Setting 5 7 1 Storage Testing Result Press MEM storage button to set the saving function the S symbol will be shown on the display The tester will save the testing results automat...

Страница 10: ...is will cause the measuring error so we design a calibration procedure of using the standard testing block to calibrate Press up and down button at the same time after the power on then the tester wil...

Отзывы: