Yamaha DTXT2S, Руководство по обслуживанию

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DTXTREME IIS
C- 13. SUB WAVE DRAM 1
[Initial indication]
[Test content]
WRITE/ READ data from SWP30 to WAVE DRAM
(IC112) and perform Verify Check.
[Test method]
Perform the test.
[Check item]
Check LCD test results.
[Indication of judgment result]
In case of OK
In case of NG
[Content of FAIL judgment]
None
[Completing the test]
OK: The test will proceed to the next one automatically.
C- 14. SUB WAVE DRAM 2
[Initial indication]
[Test content]
WRITE/ READ data from SWP30 to WAVE DRAM
(IC113) and perform Verify Check.
[Test method]
Perform the test.
[Check item]
Check LCD test results.
[Indication of judgment result]
In case of OK
In case of NG
13 SUB WAVE DRAM 1
14 SUB WAVE DRAM 2
13 SUB WAVE DRAM 1
OK
14 SUB WAVE DRAM 2
OK
13 SUB WAVE DRAM 1
FAIL
14 SUB WAVE DRAM 2
FAIL
C- 12. SUB EFFECT DRAM
[Initial indication]
[Test content]
WRITE/ READ data from SWP30 to DRAM (IC116)
and perform Verify Check.
[Test method]
Perform the test.
[Check item]
Check LCD test results.
[Indication of judgment result]
In case of OK
In case of NG
[Content of FAIL judgment]
None
[Completing the test]
OK: The test will proceed to the next one automatically.
12 SUB EFFECT DRAM
12 SUB EFFECT DRAM
OK
12 SUB EFFECT DRAM
FAIL
C- 11. SUB WAVE ROM 6
[Initial indication]
In case of NG
11 SUB WAVE ROM 6
11 SUB WAVE ROM 6
OK
11 SUB WAVE ROM 6
FAIL (XXXX)
Checksum in case of XXXX
[Content of FAIL judgment]
None
[Completing the test]
OK: The test will proceed to the next one automatically.
[Test content]
Read data from WAVE ROM 6 (IC111) via SWP30 and
perform Verify Check.
[Test method]
Perform the test.
[Check item]
Check LCD test results.
[Indication of judgment result]
In case of OK
NG: For handling the FAIL judgment,
see "B. CARRYING ON THE TEST".
NG: For handling the FAIL judgment,
see "B. CARRYING ON THE TEST".
NG: For handling the FAIL judgment,
see "B. CARRYING ON THE TEST".