www.ti.com
Board Setup
3
SLVUAU1 – October 2016
Submit Documentation Feedback
Copyright © 2016, Texas Instruments Incorporated
TPD8S300 Evaluation Module
Figure 1. CC1 Line Short to 20-V Waveform
2.2
ESD Testing
Figure 2
shows the TPD8S300EVM. The EVM has four ESD test points, one on each CC and SBU line,
that allow the user to use a ESD simulator in either contact or air-gap test mode to measure the ESD
protection provided by the TPD8S300. Probe points one and two correspond to the SBU2 and SBU1 lines
respectively. Probe points four and five correspond to the CC1 and CC2 lines respectively. To measure
the ESD response on the D± lines use an ESD simulator on the respective points on a break-out board
plugged into J2. Refer to the application report,
IEC 61000-4-x Tests for TI’s Protection Devices
for
specifics on proper ESD testing methods.
Figure 2. TPD8S300EVM