ESD Simulator
Typical Position for
Direct Discharge
Ground Reference Plane
Power and Ground Connection
DUT or System
Horizontal Coupling
Plane (HCP)
To Wall
Ground
470 k
O
470 k
O
Non-conducting Table
Insulation
Setup
4
SLVUAN8 – April 2016
Copyright © 2016, Texas Instruments Incorporated
TPD1E04U04 Evaluation Module
Figure 2. System Level ESD Test Setup
3.1.2
Evaluation of Test Results
Connect the tested device on the EVM to a curve tracer both before and after ESD testing. After each
incremental level, if the IV-curve of the ESD protection diode shifts ±0.1 V, or leakage current increases by
a factor of ten, then the device is permanently damaged by ESD.
3.2
Scattering Parameters
A TPD1E04U04 (D6) is configured with 2 SMA (J1 and J2) connectors to allow 2-port analysis with a
vector network analyzer. Connect Port 1 to J1 and Port 2 to J2. This configuration allows for the following
terminology in 2-port analysis:
•
S
11
: Return loss
•
S
21
: Insertion loss
3.3
±8-kV ESD Clamping Waveforms
A TPD1E04U04 (D6) has two SMA connectors (J1 and J2) which can be used for capturing clamping
waveforms with an oscilloscope during an ESD strike. Caution must be taken when capturing clamping
waveforms during an ESD event so as not to damage the oscilloscope. The following procedures outlines
a proper method.
