STC Control Registers
452
SPNU563A – March 2018
Copyright © 2018, Texas Instruments Incorporated
Self-Test Controller (STC) Module
10.8.7 Self-Test Fail Status Register (STCFSTAT)
This register is described in
and
NOTE:
The three status bits can be cleared to their default values on a write of 1 to the bits.
Additionally when the STC_ENA key in STCGCR1 is written from a disabled state to an
enabled state, the three status bits get cleared to their default values. This register gets reset
to its default value with power-on reset assertion.
When multiple segments are enabled in a self-test run, the STC will indicate the self-test
complete on the first failed interval corresponding to a segment. The subsequent segments
will not be run. FSEG_ID bits in this register indicate which segment failed.
Figure 10-14. Self-Test Fail Status Register (STCFSTAT) [offset = 18h]
31
16
Reserved
R-0
15
5
4
3
2
1
0
Reserved
FSEG_ID
TO_ERR
CORE2_FAIL
CORE1_FAIL
R-0
RCP-0
R/W1CP-0
R/W1CP-0
R/W1CP-0
LEGEND: R/W = Read/Write; R = Read only; W1CP = Write 1 to clear in privilege mode; -
n
= value after reset
Table 10-15. Self-Test Fail Status Register (STCFSTAT) Field Descriptions
Bit
Field
Value
Description
31-5
Reserved
0
Reads return 0. Writes have no effect.
4-3
FSEG_ID
Failed Segment Number
0
Segment 0 Failed
1
Segment 1 Failed
All other values
Reserved
2
TO_ERR
Timeout Error
0
No time out error occurred.
1
Self-test run failed due to a timeout error.
1
CORE2_FAIL
CORE2 failure info for segment 0 only.
0
No MISR mismatch for CORE2.
1
Self-test run failed due to MISR mismatch for CORE2.
0
CORE1_FAIL
CORE1 failure info for segment 0 only.
0
No MISR mismatch for CORE1.
1
Self-test run failed due to MISR mismatch for CORE1.